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Results 1 - 10 of 140 for Coating thickness measurements
  • Supplier Profile
    SemiconSoft, Inc is the premier source of thin-film thickness measurement instruments. SemiconSoft offers thin film measurement systems, optical spectroscopy tools and data analysis software. The...
  • Supplier Profile
    Analytik distribute the CPS Disc Centrifuge which measures highly poly-dispersed particles in the size range of ~2.0nm to ~75 microns at 2 to 10 times better resolution than any other particle sizing...
  • Supplier Profile
    Oxford Instruments X-ray Technology is recognized as a global leader in the design and manufacture of integrated X-ray solutions, including: x-ray tubes, power supplies, and integrated x-ray sources....
  • Supplier Profile
    Eastern Applied XRF provides both new and used XRF analyzers for a variety of testing needs. We also offer full service and support for all models of X-ray Fluorescence. New instruments...
  • Article - 7 Nov 2007
    Characterization of heterogeneous systems on the nanometer scale continues to grow in importance and to impact key applications in the field of materials science (phase segregated systems),...
  • Article - 7 Nov 2007
    The Digital Pulsed Force Mode (DPFM) provides new perspectives for materials research on the nanometer scale. Its ability to store the full tip-sample interaction during an AFM imaging process allows...
  • Supplier Profile
    Hiden Analytical was founded in 1981 and is presently situated in a 2,130m2 manufacturing plant in Warrington, England with a staff of over 50. As a privately owned company our reputation is built on...
  • Article - 25 Feb 2019
    In this article thin measurement on angled surfaces is discussed, how it can be done and what to expect and what you need to do it.
  • News - 24 Apr 2010
    The new CCI SunStar merges world leading non-contact dimensional measurement capability with advanced thin and thick film technology. Talysurf CCI delivers results you can trust with industry...
  • News - 8 Jun 2009
    FRT, a trusted partner for industry-proven metrological surface measuring systems, presents a new optical film thickness measuring tool at this year's Laser 2009 in Munich. The new MicroSpy FT...