Article - 31 May 2018
Future of Nanotechnology is an active topic of discussion among researchers, futurists, industrialists, technologists, engineers as well as people of non-scientific backgrounds. Since nanotechnology...
Article - 23 Apr 2018
In 1991, Iijima discovered carbon nanotubes (CNTs). Since then, a new branch of knowledge in materials science has emerged – Nanoscience. In order to unveil the secrets of the innovative materials,...
Article - 5 Jun 2017
The Anasys nanoIR3 AFM-IR spectrometer allows scientists to observe, image and characterize 2D materials at the nanoscale.
Article - 25 Apr 2017
Samuel Halim, CEO and founder of Avantama AG, talks to AZoNano about the advances in quantum dot technology for the display industry.
Article - 18 Oct 2016
Semiconductor devices form the foundation of modern electronics and play a key role in the function of electrical circuitry.
Article - 13 May 2016
Scanning microwave impedance microscopy, also known as sMIM, is an atomic force microscopy (AFM)-based method used for the characterization of materials and devices.
Article - 3 Nov 2015
In this interview, Sergei Magonov, President of NT-MDT Development, talks about the latest developments in the capabilities of NT-MDT’s range of AFMs.
Article - 10 Dec 2014
In this interview, James Murray from MetNano talks about their unique, patented process for producing high quality silver colloids and nanoparticles, scalable to industrial volumes.
Article - 8 Dec 2014
In this interview, Dr Curt Sander, founder and CEO of SPM manufacturer DME, talks to AZoNano about the origins of SPM technology.
Article - 28 May 2014
Karen Salvala, President of SEMI Americas, talks to AZoNano about SEMICON West 2014 and it's position in the nanotechnology sector.