Search

Search Results
Results 1 - 10 of 78 for Kelvin Probe Force Microscopy
  • Nanosurf AG
    Supplier Profile
    Nanosurf: Zoom into the future Nanosurf is a company that thrives on challenges at the frontier of what is physically achievable. By concentrating our collective efforts on the obstacles that stand...
  • Bruker Nano Surfaces and Metrology
    Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • Asylum Research - An Oxford Instruments Company
    Supplier Profile
    Asylum Research is the technology leader in atomic force probe microscopy (AFM) for both materials and bioscience applications.  Founded in 1999, we are dedicated to innovative...
  • Semilab Semiconductor Physics Laboratory
    Supplier Profile
    Semilab Semiconductor Physics Laboratory designs, produces and sells metrology equipment for the characterization of semiconductor and photovoltaic materials, for monitoring the manufacturing process...
  • Bruker Launch PeakForce Kelvin Probe Force Microscopy for AFMs
    News - 13 Aug 2012
    Bruker announced today the release of the new PeakForce Kelvin Probe Force Microscopy (KPFM) mode for its line of atomic force microscopes (AFMs). PeakForce KPFM utilizes frequency-modulation...
  • New Way to Interpret Images Generated by Kelvin Probe Force Microscopy
    News - 16 Sep 2009
    A doctoral student at the research center Forschungszentrum Dresden-Rossendorf (FZD) suggests interpreting the images generated by Kelvin probe force microscopy in a new way. She recently published...
  • Bruker BioAFM
    Supplier Profile
    Bruker BioAFM, former JPK Instruments AG,  is a lead­ing man­u­fac­tur­er of nano-an­a­lyt­i­cal in­stru­ments - par­tic­u­lar­ly based...
  • Discover Kelvin Probe Force Microscopy (KPFM)
    Article - 7 Dec 2022
    Kelvin probe force microscopy (KPFM) maps surface potential differences, enhancing AFM accuracy by offsetting electrostatic influences.
  • Modern and Advanced Kelvin Probe Force Microscopy (KPFM)
    Article - 7 Dec 2022
    Kelvin Probe Force Microscopy (KPFM) measures surface potential with improved spatial resolution, crucial for material research. #forceMicroscopy #microscopy
  • PeakForce Kelvin Force Probe Microscopy (KPFM) Module for Atomic Force Microscopes from Bruker
    Equipment
    Bruker’s PeakForce KPFM™ module for the Dimension Icon® and MultiMode® 8 AFMs combines the complete set of KPFM detection mechanisms, including amplitude and frequency modulation, with both...

Terms

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.

Provide Feedback