Measuring Controlling Devices - AZoNano Search

Tuneable Plastic Lighting with Carbon Nanotube Polymer Nanocomposites

Article - 7 Dec 2012

In this interview, David Carroll, Director of the Center for Nanotechnology and Molecular Materials at Wake Forest University, talks to AzoNano about their new FIPEL lighting technology, how it will...

Nanotechnology in Scotland: Market Report

Article - 23 Nov 2012

Part of the United Kingdom, Scotland comprises more than 790 islands, including the Northern Isles and the Hebrides.

Is Nanotechnology a Green Industry?

Article - 17 Aug 2012

Nanotechnology is billed to revolutionize many areas of science and industry. But will it be a green revolution? This article explores the environmental pros and cons of nanotech.

What is a Molecular Switch?

Article - 9 Jul 2012

The computing industry demands ever smaller, faster, and more efficient processors, and we are beginning to encounter limits to just how small the necessary components can be made. Making switches...

Nanotechnology for Diabetes Treatment

Article - 27 Jun 2012

Nanomedicine could greatly improve quality of life for diabetes sufferers, from more accurate and convenient glucose monitoring systems to potential cures.

High Throughput-High Resolution Sidewall Imaging Using 3D AFM

Article - 26 Mar 2012

Height measurement by AFM is crucial in metrology, however it would also benefit from the capability to perform sidewall roughness imaging.

Materials Science on a Single Defect Level - Dimensions of Complexity

Article - 27 Nov 2011

The statement that a materials functionality is controlled by defects is perhaps the most recognized paradigm of materials science, solid state electrochemistry, and condensed physics alike.

Using a Helium Ion Microscope to Create Nanoscale Lithographic Patterns

Article - 26 Sep 2011

To use electron or ion beams to create nano-patterns the three methods that are typically used include ion beam milling, beam induced chemistry (deposition and etch), and beam induced lithography....

PeakForce TUNA and Other AFM Modes for Electrical Properties Measurement

Article - 12 Apr 2011

Bruker's PeakForce TUNA technique is easy to use and proves to be the most capable method of force control mapping, especially for delicate samples and measuring electrical properties. Other TUNA...

Direct-Write Fabrication of 1D Transistors and Non-CMOS Logic Gates: A Stimulus for Nanoelectronics to Mature

Article - 19 Sep 2010

IBN's single-step fabrication technique obviates the time-consuming and labor-intensive lithography process for nano-scale device fabrication, and enhances the fabrication accuracy and yield.