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Market Report: Transmission Electron Microscopy (TEM) in Nanoscience

Article - 17 Mar 2023

The global transmission electron microscope market is rapidly expanding due to the increasing demand for analytical and structural characterization of nanostructured materials and is projected to...

How an XY Stage Can Upgrade a Microscope

Article - 24 Nov 2020

One of the most important aspects of microscope automation is the XY motorized stage. This stage provides a means of precisely and accurately moving a sample into the instrument’s optical axis.

Vibration Isolation Stages in Scanning Electron Microscopy (SEM)

Article - 19 Mar 2013

In 1935, Max Knoll created the first scanning electron microscope (SEM). His design was further worked upon by Manfred von Ardenne over the next few years.

Compass™ -Micro Lens Process Metrology Systems

Equipment

The Compass™ metrology systems available from ZYGO® have set the standard for non-contact, automated 3D surface metrology and production process control for discrete micro lenses and molds crucial to...

Micromechanical Testing and Assembly System with Nanoindentator - FT-MTA03

Equipment

The FT-MTA03 Micromechanical Testing and Assembly System is a highly versatile testing instrument used to accurately quantify mechanical properties.

Park NX20 – AFM for Large Samples and Failure Analysis

Equipment

Park NX20 large sample AFM is rated very highly in the hard disk and semiconductor industry for its data accuracy.

NaniteAFM — AFM for Large Samples

Equipment

The NaniteAFM is an AFM for large samples and has a tip-scanner, two inspection video cameras and an on-board approach motor in an exceptionally small footprint.