Integrated Dynamics Engineering (IDE) is a worldwide leader developing and manufacturing environmental controls for EMI active compensation and active and passive vibration and acoustic isolation...
Article - 10 Apr 2008
SUSS MicroTec is a global supplier of production and test equipment for the semiconductor and related industries. SUSS is especially present in Advanced Packaging, MEMS, Nanotechnology, Compound...
Article - 7 Jul 2005
The successful growth of nanotechnology can only occur if the right tools and instruments are available. Current and future markets, global competition, technical challenges faced by manufacturers,...
News - 23 Jun 2010
Today KLA-Tencor Corporation (Nasdaq: KLAC), the world's leading supplier of process control and yield management solutions for the semiconductor and related industries, introduced the Archer 300...
News - 7 Sep 2012
KLA-Tencor has introduced an overlay metrology system called the Archer 500 for key chipmakers to take overlay error measurements for developing and mass-producing multi-patterning process layers at...
News - 17 Jan 2008
MicroTec, a leading supplier of precision manufacturing and
test equipment for the semiconductor and emerging markets, announced
today it has shipped and successfully installed...
News - 21 Apr 2015
Applied Materials today announced the Applied Centura® Tetra(TM) Z Photomask Etch system for etching next-generation optical lithographic photomasks needed by the industry to continue multiple...
News - 9 Jul 2008
MIT researchers have achieved
a significant advance in nanoscale lithographic technology, used in the manufacture
of computer chips and other electronic devices, to make finer patterns of...
News - 27 Mar 2014
OAI, designers and manufacturers of precision, cost-effective equipment for the Semiconductor MEMS, PV solar energy, nanotechnology and microfluidics today introduced the new non-contact...
ZYGO designs, manufactures, and distributes high-end optical systems and components for metrology and end-user applications. ZYGO's metrology systems are based on optical interferometry measuring...