Article - 13 May 2005
Laser Scanning Confocal Microscopy (LSM or LSCM) and Scanning Near-Field Optical Microscopy (SNOM) are the two optical microscopy techniques used to break the diffraction limit of resolution. Both...
Article - 26 May 2005
Scanning Near-Field Optical Microscopy (SNOM) lets scientists study forbidden light and allowed light. This article looks at forbidden light, allowed light, the Constant Height Mode Scanning process,...
Article - 21 Apr 2005
Scanning Near-Field Optical Microscopes (SNOM or NSOM) offer far greater resolution than traditional optical microscopes. Conducting experiments using SNOM, feedback mechanisms, Photon Scanning...
Article - 23 Jun 2010
SNOM is the acronym for Scanning Near-Field Optical Microscopy, an alternative name for NSOM (Near-Field Scanning Optical Microscopy). The resolution achieved is far better than that which...
Article - 21 Jan 2008
This article examines the use of various NTEGRA products from NT-MDT for overcoming the short comings or failures of straight scanning probe microscopy
Article - 12 Jun 2010
Combination of Atomic Force Microscopy (AFM), Raman / Fluorescence / Rayleigh microscopy and Scanning Near-Field Optical Microscopy (SNOM) provides unique opportunities for Graphene investigation.
Article - 26 Jul 2006
Combining Atomic Force Microscopy (AFM) and fluorescence microscopy (FM) has long been of interest for biologists. This article describes the instrumentation and setup, sample preparation,...
Article - 27 Oct 2008
Scanning near-field optical microscopy (SNOM) gives an ability to study optical properties of the sample (reflectivity, light transmission, light scattering) with the spatial resolution of tens of...
Article - 7 Mar 2013
In AFM, a sharp tip is held at close proximity with a sample using a force-based feedback loop.
Article - 6 May 2011
WiTec systems have come up with a new series of microscopes that are flexible and can be used in different microscopic applications. The new series is named Alpha Series and combine Atomic force...