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Results 21 - 30 of 102 for Tribology
  • Supplier Profile
    Micro Photonics is the leading source of advanced instrumentation for scientific and industrial research. Thousands of clients rely on us for innovative solutions, technically superior products,...
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    Alemnis enables breakthrough academic research in material science by providing leading-edge micro- and nanomechanical property measurement instruments that can be applied in a wide variety of testing...
  • News - 10 Apr 2013
    Bruker’s Nano Surfaces division announced today that they have shipped the first unit of the newly redesigned Universal Mechanical Tester (UMT) to the Nano Mechanics and Tribology Laboratory...
  • News - 18 Nov 2008
    David Burris, University of Delaware assistant professor of mechanical engineering, has won the Marshall B. Peterson Award from the American Society of Mechanical Engineers (ASME). The award is given...
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    Nanovea began designing and manufacturing instruments after years of experience in providing solutions for profilometry, mechanical and tribology applications. Firmly aligned with its vision. Nanovea...
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    MARC provides an infrastructure for all types of manufacturing related research by initiating and implementing research programs and agendas that optimize the many strengths that are already in place...
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    RHK delivers compelling value and proven quality to broaden the frontiers of atomic scale research. We stand ready to meet your specifications and exceed your expectations. RHK’s surface...
  • News - 25 May 2015
    That's a low estimate of how much friction and wear costs the U.S. every year. In fact, studies suggest that so-called "normal wear and tear" costs industrialized countries some 2 to 6...
  • News - 28 Jan 2009
    The x-rays produced in the peeling of Scotch Tape find origin in the field of tribology where photons and electrons are produced by fracturing or rubbing materials. Tribology has a long history...
  • Article - 13 Dec 2009
    NanoElectroMechanical Systems (NEMS) have critical structural elements at or below 100 nm. This distinguishes them from MicroElectroMechancial Systems (MEMS), where the critical structural elements...

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