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Results 11 - 20 of 173 for XPS
  • Using Different Photon Energies to Eliminate Core Line/Auger Peak Overlap in XPS
    Article - 5 Mar 2020
    This article discusses how to remove auger peak and core line overlap using differing photon energies.
  • Combining AFM with XPS to Analyze Graphene Oxide Membranes
    Article - 23 Mar 2017
    Graphene oxide (GO) is a two-dimensional nano-material consisting of a graphene monolayer highly functionalized with oxygen-containing chemical groups.
  • Hiden Analytical
    Supplier Profile
    2022 marks Hiden Analytical’s 40th year of continuous and independent operation in the field of mass spectrometry.  Driven by customer and application focussed innovation, a unique and...
  • Thermo Fisher Scientific – Materials & Structural Analysis
    Supplier Profile
    Thermo Fisher Materials and Structural Analysis products give you outstanding capabilities in materials science research and development. Driving innovation and productivity, our portfolio of...
  • 10 Angstroms
    Supplier Profile
    10 Angstroms is a new company dedicated to bringing innovative systems and equipment to the nanotechnology R&D market. We provide both sales and service representation for advanced...
  • Tilt-Tip Nanopositioning System - XPS-Theta-Gamma-2A
    Equipment
    The XPS-Theta-Gamma-2A has been developed for applications requiring high speed positioning of mirrors in optical inspection and imaging systems. The mirror is simply fixed onto the tilting platform...
  • HORIBA
    Supplier Profile
    HORIBA, headquartered in the United States, provides an extensive array of instruments and solutions for applications across a broad range of scientific R&D and QC measurements. HORIBA is a world...
  • Leica Microsystems GmbH
    Supplier Profile
    Leica Microsystems is a world leader in microscopes and scientific instruments. Founded as a family business in the nineteenth century, the company’s history was marked by unparalleled...
  • Bruker Nano Surfaces and Metrology
    Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • XEI Scientific
    Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...

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