Anasys Instruments provides innovative AFM and related accessories which offer chemical, mechanical, and thermal analysis at the sub-100nm scale. The Company’s technology and products are being used to address metrology and analysis challenges in the polymers, pharmaceuticals, data-storage, and advanced-materials markets.
Anasys has been awarded numerous awards which establish Anasys as leaders in innovative technology, including the inaugural MICRO/NANO 25 Award in 2007, the R&D 100 Award in 2010 for the nanoIR and Microscopy Today’s 2011 Innovation Award for their breakthrough AFM-IR platform.
Materials Characterization Instrumentation
Anasys Instruments Introduces the nanoIR2-FS High Speed Nanoscale IR Spectroscopy System
Breakthrough Nanoscale IR Spectroscopy Platform Combines AFM-IR and sSNOM
Review Paper on Combining Atomic Force Microscopy and Infrared Spectroscopy (AFM-IR) Persists as a Top-Downloaded Publication
NIST Researchers Capture Nanoscale Spectra of Plasmonic Nanostructures Using AFM-IR
EPFL Poster on AFM-IR Technique Application Becomes Winner at Swiss Physics Society Meeting
Anasys Instruments Reports on EPFL's use of Nanoscale IR Spectroscopy to Demonstrate a to ß Secondary Structure Transition
Anasys Instruments Reports on New NIST Publication on AFM-IR has Implications for Catalysis Research
Anasys nanoIR Technology Used to Study Photosynthesis
Anasys Instruments Release Second Generation AFM-based IR Spectroscopy
Three New Research Papers Published by Users of Anasys nanoIR
NIST Use Anasys Nanoscale AFM-IR Imaging to Characterize Plasmonics
Near-field Behaviour of Semiconductor Plasmonic Microparticles Study - Report by Anasys
Anasys AFM-IR Technology Used by University of Illinois for Nanoscale Chemical Identification
Anasys Announce Lorentz Contact Resonance Imaging is Now Available for afm+ and nanoIR Instruments
EPFL Researchers Study Drug-Resistant Bacteria with Anasys AFM-IR system
Anasys Report on NIST Research Using PTIR (AFM-IR)
Anasys Will Discuss Improvements to Their AFM-IR Nanoscale Spectroscopy Products at Pittcon 2013, Booth #3050
Anasys Review Paper on Nanoscale AFM-IR Makes Cover of Applied Spectroscopy Journal
Researchers Use Anasys Nanoscale Thermal Analysis Instruments to Develop Improved Drug Delivery Systems
NIST Advances Nanoscale Characterization of Materials Using AFM-Based Spectroscopy
Critically Needed Chemical Metrology Enabled By AFM-IR
AFM and Nanoscale IR Spectroscopy Used to Reverse Engineer Polymers
Anasys Instruments Nano Thermal Analysis Paper Wins Award from ANTEC 2011
Anasys Instruments Add Arbitrary Polarization Control to Their nanoIR Platform
Researchers Perform Nanoscale Thermal Analysis on Stiff Materials Using Magnetic Actuation
AFM-IR Technology Featured in Keynote Publication in Applied Spectroscopy
Anasys Instruments Win 2011 Innovation Award for AFM-IR Technology
Anasys Instruments Advisor Appointed Bliss Professor at University of Illinois at Urbana-Champaign
Researchers Address Molecular Mapping Challenge with AFM-IR
Anasys nanoIR Wins Prestigious R+D 100 Award
Powerful New Measurement Tool that Reveals Chemical Composition of Samples at the Nanoscale
Anasys Webinar on The World's Smallest Heat Source
Polarization Control Technology and NanoIR from Anasys Instruments
Jingang Li, Ph.D.
In this interview, AZoNano discusses the development of a novel solid-state optical nanomotor, which is driven by light.
Professor Jacek Jasienak
In this interview, we discuss a nanoparticle ink used to produce low-cost printable perovskite solar cells, helping to catalyze the technology transition toward commercial viable perovskite-based devices.
Ping Wang, Ph.D.
We speak with researchers behind the latest advancement in graphene hBN research that could boost the development of next-generation electronic and quantum devices.
Inoveno’s PE-550 is a best-selling electrospinning/spraying machine that can be used for the continuous production of nanofibers.
The Filmetrics R54 advanced sheet resistance mapping tool for semiconductor and compound semiconductor wafers.
The Filmetrics F40 turns your benchtop microscope into an instrument for measuring thickness and refractive index.