Antaria was first formed in 1997 to commercialise advanced materials technology originally developed by the University of Western Australia. The technology was first scaled-up via a joint venture with Samsung Corning Co. Ltd, of Korea (2000 to 2004), and then as a stand-alone operation.
Antaria has expanded from its original research-based foundations to the development of a broader range of advanced materials opportunities. Antaria’s core skills now include the development, scaling-up, manufacturing and marketing of innovative products based on a range of proprietary advanced material technologies and manufacturing processes. To date, Antaria’s commercialised products include advanced metal oxides powders and dispersions of zinc oxide, aluminium oxide and cerium oxide.
Ping Wang, Ph.D.
We speak with researchers behind the latest advancement in graphene hBN research that could boost the development of next-generation electronic and quantum devices.
Dr. Laurene Tetard
AZoNano speaks with Dr. Laurene Tetard from the University of Central Florida about her upcoming research into the development of nanotechnology that can detect animal-borne diseases. The hope is that such technology can be used to help rapidly control infected mosquito populations to protect public
Dr. Amir Sheikhi
AZoNano speaks with Dr. Amir Sheikhi from Pennsylvania State University about his research into creating a new group of nanomaterials designed to capture chemotherapy drugs before they impact healthy tissue, amending a fault traditionally associated with conventional nanoparticles.
The Filmetrics F40 turns your benchtop microscope into an instrument for measuring thickness and refractive index.
Nikalyte’s NL-UHV is a state-of-the-art tool that allows the generation and deposition of nanoparticles in an Ultra-High vacuum onto a sample to create a functionalized surface.
The Filmetrics® F54-XY-200 is a thickness measurement tool created for automated sequence measurement. It is available in various wavelength configuration options, allowing compatibility with a range of film thickness measurement applications.