Advanced Diamond Technologies, Inc. (ADT) was formed in December 2003 to commercialize Ultrananocrystalline Diamond™ (UNCD™) technology from Argonne National Laboratory. ADT is the licensee to the Argonne portfolio of application and process patents for using and synthesizing UNCD films.
ADT is the recipient of
the 2006 Frost & Sullivan’s Product Innovation of the Year award, the Nanotech Briefs’ Nano
50™ Award, and a runner-up in this year’s Wall Street Journal Technology Innovation Award
Advanced Diamond Technologies Receives R+D 100 Award for Integrated RF MEMS Switch/CMOS Device
Merck-Millipore Selects ADT's Thin-Film Form of Nanocrystalline Diamond Bearings
ADT Secures SBIR Fund for Developing New Pad Conditioners
Reliably and Affordably Design Micro Devices and Sensors Out of Diamond
Ping Wang, Ph.D.
We speak with researchers behind the latest advancement in graphene hBN research that could boost the development of next-generation electronic and quantum devices.
Dr. Laurene Tetard
AZoNano speaks with Dr. Laurene Tetard from the University of Central Florida about her upcoming research into the development of nanotechnology that can detect animal-borne diseases. The hope is that such technology can be used to help rapidly control infected mosquito populations to protect public
Dr. Amir Sheikhi
AZoNano speaks with Dr. Amir Sheikhi from Pennsylvania State University about his research into creating a new group of nanomaterials designed to capture chemotherapy drugs before they impact healthy tissue, amending a fault traditionally associated with conventional nanoparticles.
The Filmetrics F40 turns your benchtop microscope into an instrument for measuring thickness and refractive index.
Nikalyte’s NL-UHV is a state-of-the-art tool that allows the generation and deposition of nanoparticles in an Ultra-High vacuum onto a sample to create a functionalized surface.
The Filmetrics® F54-XY-200 is a thickness measurement tool created for automated sequence measurement. It is available in various wavelength configuration options, allowing compatibility with a range of film thickness measurement applications.