Bede is the global leader in non-destructive X-ray metrology systems for 90nm technology nodes and below. Bede systems deliver dramatic yield enhancement through the absolute measurement of semiconductor material properties. These include not only thickness, but also measurements of structure, roughness and composition that are crucial for new materials and processes.
Bede systems incorporate one or more of the following X-ray techniques to optimize sensitivity to a given customer process:
High-Resolution X-ray Diffraction (HRXRD)
X-ray Diffraction (XRD)
X-ray Reflectivity (XRR)
X-ray Fluorescence (XRF)
X-ray Diffraction Imaging (XRDI)
Bede's process control solutions provide fast measurement capability on <100 micron test pads and in scribe-lines on product wafers with ScribeView™, reducing process development costs and eliminating the need for monitor wafers.
Professor Andre Nel
In this interview, AZoNano speaks with Professor Andre Nel about his involvement in innovative research describing the development of a 'glass bubble' nanocarrier that could help drug formulations access pancreatic cancer cells.
Jingang Li, Ph.D.
In this interview, AZoNano speaks with Jingang Li from the University of California, Berkley, who offers an introduction to the Nobel Prize-winning technology, Optical Tweezers.
Steve Kosier, Ph.D.
In this interview, we speak with SkyWater Technology about the current state of the semiconductor industry, how nanotechnology has helped to shape this sector, and their new partnership which aims to increase the accessibility of semiconductor chips for start-ups and research groups across the Unite
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The Filmetrics R54 advanced sheet resistance mapping tool for semiconductor and compound semiconductor wafers.