Plateau Tip Silicon-SPM-Probes from NANOSENSORS

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.

The plateau tips are available on various cantilever geometries covering force constants ranging from 0.2 N/m to 48 N/m and resonance frequencies from 13 kHz to 330 kHz. The diameter of the plateau face can be adjusted between 1.8 µm (standard type) and 10 µm (customized type).

Probe Features at a Glance

  • Well-defined plateau shape
  • Standard type available from stock
  • Customized shape option
  • Single crystalline silicon
  • Chemically inert
  • High mechanical Q-factor for high sensitivity

Other Equipment by this Supplier

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