Nanotechnology Videos

Featured Nanotechnology Videos

Particle X-Plorer Software Module - RETSCH TECHNOLOGY

The RETSCH TECHNOLOGY software module Particle X-Plorer is used in both our particle analysis systems CAMSIZER P4 and CAMSIZER X2 and offers the user a wealth of features and possibilities to obtain in-depth knowledge of his sample.

CAMSIZER X2 - RETSCH TECHNOLOGY - Short Introduction

The quality control of fine powders can be substantially improved with the new CAMSIZER X2: More precise and faster analysis of particle size and particle shape helps to improve the product quality, reduce rejects and save labor costs, energy and raw materials.

Optical Profiler - The ContourGT-X8 from Bruker

Eric Rufe from Bruker Nano Surfaces shows us their ContourGT-X8 optical profiler. It is effectively a 3-dimensional microscope and features the 10th generation of this technology.

Nanotribometer from CSM Instruments - Features and Applications

Nicholas Randall from CSM Instruments introduces us to their latest nanotribometer which is a compact desktop model featuring improved applied load and tangential force sensors. It is suited to study tribology at the nanoscale.

The Zeta-20 Optical Profilometer from Zeta Instruments

Ben Garland from Zeta Instruments demonstrates their Zeta-20 Optical Profilometer which can measure surface and textural properties of materials such as solar cells, microfluidics, biologicals etc. It does this by taking image slices and creating a composite 3-D image featuring real color. Their software package allows easy analysis of surface features and the ability to produce statistical analyses.

Tribology and Mechanical Testing Workshop at the University of Sheffield from Bruker Nano Surfaces

On May 22nd 2013 - AZo.TV attended the Tribology and Mechanical Testing Workshop by Bruker Nano-Surfaces at the University of Sheffield. Taking part in workshops and seminars with such experts as Steve Shaffer, PhD - senior applications scientist.

Particle Analysis of Spray Dried Powders - CAMSIZER X2

Particle size analysis of spray dried powders in the RETSCH TECHNOLOGY CAMSIZER X2.

The Malvern Instruments Mastersizer 3000 Particle Size Analyzer

Julie Chen from Malvern Panalytical gives us a tour of the new Mastersizer 3000 particle size analyzer. She outlines the upgrades from the previous generation Mastersizer 2000.

What is Graphene? - Animated Video by Bluestone Global Tech

An animated video to explain why graphene matters from Bluestone Global Tech

Examining Atomic Point Defect Dynamics in Bacteriorhodpsin with the Cypher AFM from Asylum Research

This video clip, captured with Asylum's Cypher AFM, shows loosely bound molecules of bacteriorhodopsin moving around on a crystal surface.

Micro Materials NanoTest Vantage Demonstration

An demonstration of the new NanoTest Vantage by Micro Materials Ltd. This video demonstrates the many advantages the Vantage system offers, including a complete range of nanomechanical and nanotribological tests in one flexible and user friendly instrument.

AUTOSAMPLER for CAMSIZER P4 - RETSCH TECHNOLOGY - Short Introduction

Whenever varying sample materials are to be analyzed or repeat measurements need to be carried out, the AutoSampler adapts perfectly to the defined measuring routine.

The SOLVER Nano Atomic Force microscope from NT-MDT

As has been their tradition, NT-MDT have launched another new product at the MRS Fall Meeting held in Boston. This year they launched the SOLVER Nano AFM (atomic force microscope).

Micro Materials Present NanoTest Vantage

An introduction to the new NanoTest Vantage by Micro Materials Ltd. Presented by Denise Hoban, this video demonstrates the many advantages the Vantage system offers, including a complete range of nanomechanical and nanotribological tests in one flexible and user friendly instrument.

Demonstration of the Dimension FastScan AFM from Bruker Nano Surfaces

Hartmut Statler from Bruker Nano Surfaces demonstrates the capabilities of the Dimension FastScan, with image refresh rates up to one frame per second or more.

The Dimension Fastscan from Bruker - The Fastest AFM on the Market

John Thornton from Bruker takes us for a tour of the Dimension Fastscan atomic force microscope AFM. This instruments' claim to fame is that it is the fastest AFM on the market. It's speed and ability to scan samples at a rapid rate without sacrificing resolution, combined with 300mm sample chuck, make it ideally suited production environments.

CAMSIZER X2 - Product Video

The quality control of fine powders can be substantially improved with the new CAMSIZER X2: More precise and faster analysis of particle size and particle shape helps to improve the product quality, reduce rejects and save labor costs, energy and raw materials.

Particle Analysis with the CAMSIZER® P4 – Retsch Technology

The CAMSIZER P4 particle analyzer has been developed to comprehensively characterize dry, free flowing bulk materials. Whereas traditional sieve analysis, for example, can only determine the approximate particle size, the CAMSIZER P4 simultaneously measures both particle size and shape – with much more detail and at a higher resolution.

'The Complete Tribology Lab' - The New UMT from Bruker

Bruker's UMT Universal Mechanical Tester. The UMT is the "complete tribology lab" and provides macro, micro and nanoscale tests under real-world conditions. Talking to Bruker's Steve Shaffer and University of Sheffield's Mark Rainforth, they discuss the ease of use and the typical applications of the UMT.

RETSCH TECHNOLOGY Company Video - Solutions in Particle Sizing

RETSCH TECHNOLOGY's core competence is to combine innovative particle characterization technology with maximum operating convenience.

The EM TIC 3X Milling System from Leica Microsystems

The EM TIC 3X Milling System surpasses conventional slope cutting instruments. It can mill at high rates, cut broad and deep into the sample, and create smooth surfaces resulting in high-quality cross-sections of almost any material, quickly and easily.

The DME BRR Hybrid SEM/AFM Scans a Single Salt Crystal

The DME BRR microscope makes it possible to investigate surfaces of places one can never find with a conventional AFM + optical microscope combination.

Materials Characterization with the NanoIR from Analsys Instruments

Curt Marcott from Light Light Solutions tells us how the NanoIR from Anasys Instruments has opened up new possibilities in materials characterization. Combining AFM and IR spectroscopy provides spatial resolution an order of magnitude better than conventional IR, which enables researchers to do such things as examine nanoparticles in a matrix, or analyze for compositions differences across in interface.

Horiba SZ-100 Nanoparticle Characterization System

The brand new SZ-100, nanoparticle size analyzer/characterization system was on show at Pittcon 2011. Mark Bumiller from Horiba introduces us to the latest addition to their particle size analyzer lineup.

Electrochemical Strain Microscopy and the Cypher AFM from Asylum Research

Asylum Research introduced the Cypher AFM two years ago. They have now added a new technique called Electrochemical Strain Microscopy to its list of capabilities. Sergei Kalinin from Oak Ridge National Laboratory explains how this technique can be used to characterize electrochemical phenomena at the nanoscale and Roger Proksch from Asylum Research demonstrates how the system produces data and its relevance to the field of battery materials.

The NanoDrop Lite from Thermo Scientific

Thermo Scientific have launched the NanoDrop Lite, the smaller version of the NanoDrop 2000 system. The system uses a UV-Vis spectrophotomer is used for the quantification of nucleic acids, DNA/RNA samples, proteins etc.

Leica Microsystems Ergonomy

In this video Wayne Buttermore, Central Regions Sales Manager at Leica Systems talks about the ergonomy of Leica cameras.

The Multiview AFM/Raman System from Nanonics Imaging

David Lewis from Nanonics Imaging Ltd shows us their Multiview Series of AFM/Raman systems that can be supplied with Renishaw or Horiba Raman systems. Nanonics can also supply the Multiview systems as upgrades to existing Raman systems of total systems.

AFM imaging of DNA related structures - Webinar by Prof Alexander Kotlyar

This great webinar by Professor Alexander Kotlyar from Tel Aviv University discusses the use of AFM techniques to analyze the structure of DNA and related structures.

RETSCH TECHNOLOGY - Motorized Guidance Sheet for CAMSIZER P4

The patented Motorized Guidance Sheet for the RETSCH TECHNOLOGY CAMSIZER P4 was exclusively designed for special applications in order to preferentially orient the particles.

CAMSIZER P4 - RETSCH TECHNOLOGY - Short Introduction

The CAMSIZER P4 particle analyzer has been developed to comprehensively characterize dry, free flowing bulk materials.