The Multiview AFM/Raman System from Nanonics Imaging
David Lewis from Nanonics Imaging Ltd shows us their Multiview Series of AFM/Raman systems that can be supplied with Renishaw or Horiba Raman systems. Nanonics can also supply the Multiview systems as upgrades to existing Raman systems of total systems.
The advantage of a combined atomic force microscope and Raman system is that it can provide information on the chemical structure of the material as well as topographical information. David also explains the advantage of their system.
Run Time - 7:29min
The Multiview AFM-Raman Series from Nanonics Imaging