Videos | Pittcon 2009 Video Interviews

Pittcon 2009 Video Interviews Videos

Pittcon 2009 Video Interviews Videos

NeoScope JCM-5000 Benchtop Scanning Electron Microscope (SEM) from JEOL

Mike Wolfe from Nikon Instruments, the distributor for the JEOL Neoscope JCM-5000 in North America and Canada demonstrates the capabilities if this compact benchtop scanning electron microscope (SEM), which is a natural extension from high end optical microscopes, but offers much better depth of field.

PANalytical AXIOS X-Ray Fluorescence (XRF) Spectrometer - Features and Applications

David Coler from PANalytical shows us through the AXIOS XRF (x-ray fluorescence) instrument that performs elemental analysis. It is suited to applications including industrial process control, in the cement, steel and petroleum industries, as well as research and development applications in both industry and academia.

The Light Engine from Lumencor

Lumencor was formed to design lighting technology for life science applications. Claudia Jaffe from Lumencor introduces us to their Light Engine which is an all-in-one device that combines: power; durability; discreetness, spectral cleanliness; long life; cool operating temperature; small footprint and; cost effectiveness.

eXpress Personal Scanning Electron Microscope from Aspex Corp

Tim Drake from Aspex Corp shows us the main features of the Personal Scanning Electron Microscope, PSEM eXpress, which is designed for rapid sample analysis. In particular, this compact benchtop SEM features a large sample chamber and easy loading mechanism.

The First Ever Global Study on The AFM Market Conducted with AFM Users

In this exclusive interview with Barbara Foster from the Microscopy and Imaging Place or The MIP conducted at Pttcon 2009, we learn about a new market report. It is in fact the first ever global report on the AFM market place using feedback from AFM users themselves.

alpha300 Raman/AFM/SNOM from WITec - Features and Applications

The WITec microscopy series features scanning probe as well as high resolution optical and Raman microscopy techniques in either a single instrument or combined system configurations for the highest flexibility throughout a wide range of microscopy applications.

Micro X-Ray Fluorescence (XRF) Product Range from Bruker AXS

Michael Haschke from Bruker AXS shows us thorugh their new range of Micro XRF (X-Ray Fluorescence) instruments.

Malvern Instruments Morphologi G3 Particle Characterization System - Features and Demonstration

Janie Dubois from Malvern Panalytical takes us for a tour of the Morphologi G3 particle characterization system. The Morphologi G3 is a microscope based system that analyzes particles based on actual images.

Neos AFM from Bruker AXS - Features and Applications

The N8 NEOS combines optical microscopy and Scanning Probe Microscopy in a single, optimized set - up.

Malvern Instruments Zetasizer Nano Particle Characterization System

Ulf Nobbmann from Malvern Panalytical shows us through the Zetasizer Nano, which uses dynamic light scattering to determine particle size, as well as being able to determine zeta potential.

LM20 Nanoparticle Analysis System from Nanosight

Nanosight have developed a unique technique for detecting and viewing nanoparticles in real time using laser light. Jeremy Warren explains how it work and the key components to their system

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.