Scientists and engineers involved in battery development or manufacturing know how difficult it can be to monitor, understand, and control the many variables that impact cell performance.
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This new whitepaper explores how advanced cross-sectional analysis of battery electrodes - using scanning electron microscopy (SEM) and broad ion beam (BIB) milling - is enabling researchers and manufacturers to gain deeper insights and improve battery performance.
What You’ll Learn in the New Whitepaper
- Methods for studying and quantifying key electrode parameters, including coating thickness, particle size, SEI formation, tortuosity, binder distribution, and cracking
- Why Broad Ion Beam (BIB) Milling is a preferred technique for high-quality electrode cross-sectioning
- How automation and AI are enhancing image analysis and quality control processes
- Techniques for reliably analyzing electrodes after formation or cycling, using vacuum transfer
- Preparing ultra-wide cross-sections for improved statistical control
Download your copy now to get and learn how to develop better batteries.
This information has been sourced, reviewed and adapted from materials provided by Hitachi High-Tech Europe.
For more information on this source, please visit Hitachi High-Tech Europe.