From today, our Hitachi Europe Twitter channel has moved. Be sure to follow us at @HitachiGlobal to keep up to date… https://t.co/CI4uYrqxmi
May 2 2022 5:30am
We have partnered with @HyperloopTT to make safer systems for Hitachi’s existing fleet of railways in Europe and be… https://t.co/l1oDBjnfKB
Apr 29 2022 10:50am
Passwords and pins can be stolen, signatures easily forged, but Hitachi’s Finger VeinID is revolutionising personal… https://t.co/OIIQdnZV0P
Apr 29 2022 5:50am
As one of the world’s leading corporations developing solutions in energy, life science and electronics nobody is better placed than Hitachi to appreciate the need to observe micro and nano scale systems.
At Hitachi High-Tech a 10,000 strong team of dedicated employees works to provide the world with a wide range of instruments which transform science and engineering. Electron microscopy is key to achieving that goal.
With more inventions and patents in electron microscopy than any other organisation you can see that innovation is at the core of our business. We developed and commercialized the first field emission SEM in 1972 – a milestone which transformed not only microscopy but also played a pivotal role in the practical development of modern microelectronics.
The innovations continued: the invention and development of in-lens FESEM in 1985 allowed Hitachi to develop the world’s highest resolution SEM, a record which the new SU9000 still holds today. But this amazing specification doesn’t tell the whole story: our field emission SEMs make sub-nanometer imaging absolutely routine for any operator by utilising a brand new, high stability cold field emission gun, as well as the most efficient and flexible electron detection available.
We’ve also brought electron microscopy to a far wider audience by pioneering and developing desktop SEMs: the TM4000 is world’s favourite electron microscope. Many thousands of scientists and engineers worldwide have selected this instrument to address their research, quality control and failure analysis needs. The TM4000 gives them valuable chemical and structural insights more quickly and easily than ever before.
For the most advanced applications, our aberration corrected (S)TEM’s and TripleBeam FIB-SEMs offer unique capabilities to enable studies of the most challenging materials. The TripleBeam technology in our NX5000 FIB-SEM ensures ultra-low-damage, ultra-thin TEM lamella can be prepared with ease, whilst the HF5000 (S)TEM provides unique materials insights with atomic resolution secondary electron (surface) imaging as well as bespoke in-situ / operando TEM capabilities.
At Hitachi we also embrace the very latest digital technologies – from machine leaning and advanced image analysis to Python-based scripting to automate complex or routine microscopy tasks.
Even the very best microscopes, however, can’t provide perfect results if the condition of the sample is poor. That’s why we’ve embarked on developing a range of preparation instruments to ensure you get the results you need. Our IM4000 and IM5000 hybrid Argon ion milling systems produce flawless cross-sections even on previously challenging composite hard/soft materials. It can also produce perfectly flat and strain-free surfaces for optimum EBSD or other analysis.
Our state-of-the-art sample cleaners, ZoneSEM and ZoneTEM, also help to ensure top quality results. Novel cleaning technology is utilised to provide gentle, controllable hydrocarbon removal even on the most sensitive materials.
Innovative products, however, mean nothing if they are not dependable. Every aspect of our instruments is meticulously engineered for stability and robustness. It’s that core principle which ensures you get the results you need quickly and easily, year after year.
Additionally, when you buy a Hitachi instrument, you don‘t just buy a product. You acquire a new business partner who’ll move forward with you by providing unparalleled service and applications support, always there to help you develop your microscopy.
Hitachi – innovation you can trust.
Regulus8230: A High Resolution Scanning Electron Microscope
HF5000: A Cold Field Emission Transmission Electron Microscope
ZoneTEM: A Sample Cleaner Utilizing UV/Ozone
ZoneSEM: A Sample Cleaner Utilizing UV/Ozone
IM5000: Advanced Ion Milling System
IM4000: An Ion Milling System
HT7800: A Fully Digital, Versatile Transmission Electron Microscope
NX5000: A High-Performance Scanning Electron Microscope
SU5000: An Analytical, Variable Pressure FE-SEM
A Schottky FE-Scanning Electron Microscope: The SU7000
Hitachi’s Thermionic Variable Pressure SEMs: The SU3800 and 3900
Hitachi Compact Scanning Electron Microscope: The FlexSEM
The TM4000 II Benchtop SEM from Hitachi
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