IM4000: An Ion Milling System

Hitachi’s IM4000Plus broad Ar+ ion milling system (BIB) helps users to cross-section or polish hard, porous, composite, soft and heat sensitive materials with seamless results.

Reliable High-Performance Milling

  • High current Ar+ beam provides quick and reliable cross-sectioning
  • Stable low kV (<1 kV) capability provided for sensitive materials
  • Final polishing, for example, for EBSD, with low angle milling (FlatMilling), or for contrasting by high angle milling (relief milling), in a matter of few minutes

IM4000: An Ion Milling System

Image Credit: Hitachi High-Tech Europe

Easy Specimen Handling

  • Ex-situ alignment of sample and mask makes installation easy and rapid
  • Load resin fitted samples measuring up to 25 mm in height and 50 mm in diameter for final polishing
  • Users can readjust milling position at all times without the need to remount the sample

Simple Operation and Maintenance

  • Simple and least parameter settings available for any type of application or sample
  • Easy setup and maintenance with a single ion beam gun
  • Constant high intensity ion beam throughout the complete voltage range, with independent ionization and acceleration voltages

Easy End-Point Detection

  • Users can note milling in real time with the help of stereomicroscope

Extendibility

  • Users can add cryo cooling for heat sensitive materials
  • Vacuum transfer can be added for oxidation sensitive specimens
Ion Milling System IM4000

Video Credit: Hitachi High-Tech Europe

IM4000: An Ion Milling System

Image Credit: Hitachi High-Tech Europe

IM4000: An Ion Milling System

Image Credit: Hitachi High-Tech Europe

IM4000: An Ion Milling System

Image Credit: Hitachi High-Tech Europe

IM4000: An Ion Milling System

Image Credit: Hitachi High-Tech Europe

IM4000: An Ion Milling System

Image Credit: Hitachi High-Tech Europe

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