Equipment |Scanning Probe Microscopes (SPM)

Scanning Probe Microscopes (SPM)

Scanning probe microscopes (SPMs) are used to create images of nanoscale surfaces and structures, possibly down to the atomic scale. These devices use a probe tip attached to the end of a cantilever to scan back and forth across exterior of a sample to produce an image. In addition to visualizing structures, some kinds of SPMs can be used to move individual atoms.

There are many kinds of SPMs. Atomic force microscopes (AFMs) gauge the electrostatic forces between the probe tip and the sample. Magnetic force microscopes (MFMs) evaluate magnetic forces between the two objects and scanning tunneling microscopes (STMs) gauge the flow of electrical current.

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