Semilab has launched the DME DS95 CompactGranite that delivers advanced AFM performance with the lowest cost per measurement for academia and industry and the utmost ease of use.
The available options and the modular system design offer plenty of opportunities for upgrading through regular accessories or finalizing the system with user-specified or customized supporting components.
- The DS 95 AFM scanner has a compact design that ensures excellent scan rates and stability
- High resolution optical camera enables a comprehensive sample view
- The completely digital C-32 SPM control electronics offers spearhead imaging control and feedback performance
Ease of Use
- The exclusive option for plug-and-play cantilever exchange ensures quick and safe operation of the system
- Samples can be easily accessed from the sides for unique stages and sample holders
- A built-in optical axis in the AFM scanner offers complete visual control during approach and positioning
The simple design ensures a low entry level in high end AFM instruments. Many upgrade possibilities help simplify the instrument for the needed application.
With the DS 95 SPM scanner range, Semilab now offers the ultimate combination of performance and ease of use. The DS 95 SPM scanner range reflects a decade-long experience in the domain of SPM application and manufacturing to help users realize the best and most consistent results in the shortest timespan.
The DME DS 95 CompactGranitestage makes it possible to examine almost all samples by SPM. From a splitter of a coated-wafer to a complete nanocoated surgical implant, the miniature granite stage will surprise users with its resilience. Thus, the design does not make any compromises with regard to stability. Atomic layers can now be scanned in a standard writing desk.
The open-tip scanner design provides space to easily access samples and offers a range of selectable XY translators and unique measurement stages as a liquid cell or temperature control stage.
Tailored illumination or sample holder and sample stages for externally shaped sample objects are also offered.
Magnetic force microscopy on MnAS thin film sample. Domains with different magnetic orientation are visualized in the phase image. Image acquired with DME DS 95 Compact granite SPM system. Image Credit: Semilab Semiconductor Physics Laboratory