Scanning Electron Microscope (SEM) Accessories

Scanning Electron Microscopes (SEM) are microscopes that employ a targeted beam of electrons on a sample surface to produce an image. With the use of accessories, SEMs can be highly-versatile tools of modern science, that can study the composition and fine details of both biological and physical samples.

Nanomechanical testing systems can complement an SEM analysis by testing the mechanical properties on a nanoscale level. Sample manipulators can move samples in very small increments in a wide range of directions. Calibration standards allow for the fine tuning of a SEM. Various preparation devices can allow for specialized testing.