Semilab’s PDL Hall system supports AC and DC Hall measurement modes. AC magnetic field measurements can be conducted on materials with mobility below 0.1 cm2/Vs, with potential advantages over the DC magnetic field measurement mode.
What Materials Could be Measured by PDL-1000?
- Wide bandgap materials
- Thermoelectric materials
- Organic electronics: OTFT, OLED
- Photovoltaics: aSi, CIGS, perovskite
- Transparent conductive oxides (TCO): ITO, AZO, ZnO, IGZO
- III-V, II-VI semiconductors and other semiconductor materials
Options
Operation of the Parallel Dipole Line magnets. Image Credit: Oki Gunawan/IBM Research
PDL-1000 setup and sample holder. Image Credit: Semilab Semiconductor Physics Laboratory
High Sensitivity Parallel Dipole Line Hall Measurement With AC/DC Magnetic Field
Key Features
- Simple operation
- Optional gate bias voltage
- Cooling system not required
- Background illumination option
- Simple and robust tabletop system design
- Uniformity (< 2 %, sample size up to 10 × 10 mm)
- High magnetic field (approximately 2.5 Tesla pk-pk)
- High sensitivity (capable of handling mobility < 0.1 cm2/Vs)
- Proprietary signal processing and user interface (UI) software
- Software-controlled measurement and automated parameter extraction
- Tabletop configuration using rotating Parallel Dipole Line magnets (a bulky electromagnet is not needed)
- A wide range of mobilities, including semi-insulating samples and extremely low mobilities (< 0.1 cm2/Vs), can be measured, with the capability to perform both conventional static magnetic field (DC) and alternating (AC) Hall measurements
- Software retrieves low Hall signals with the help of software-based lock-in detection (this eliminates the need for expensive hardware-based lock-in detection)
Measurement results. Image Credit: Semilab Semiconductor Physics Laboratory
Screen copy of PDL-1000 measurement sequence. Image Credit: Semilab Semiconductor Physics Laboratory
PDL-1000 with CRPH option. Image Credit: Semilab Semiconductor Physics Laboratory