Semilab Semiconductor Physics Laboratory designs, produces and sells metrology equipment for the characterization of semiconductor and photovoltaic materials, for monitoring the manufacturing process of semiconductor devices and solar cells, and also for R&D purposes in these areas. Semilab offers a variety of measurement techniques; most of them are non-contact and non-destructive. Many of Semilab's technologies can be flexibly integrated in different platforms, ranging from simple handheld devices and table-top systems with high resolution mapping capability to fully automated stand-alone production control tools for mid-range and high-level fablines. Semilab also offers in-line measurements for solar cell production lines.
Our strategy is to continuously improve our products, and to offer flexible solutions for our customers' needs with high-value products for a reasonable price. To accomplish this, Semilab employs more than 70 physicists and 90 engineers worldwide. Semilab also participates in various international R&D projects, and Semilab has a frame agreement for metrology development with IMEC, the largest international research center for the development of semiconductor products.
Semilab carries out our work in a responsible way; Semilab provides various benefits to our employees and support important cases such as scientific education.
SEM, AFM, Correlative Microscopy and Heterostructure Analysis
Dielectric Film Measurement: What is it and Why is it Important?
Ellipsometry: Principles and Usage in Optics
Measuring Nanohardness via Nanoindentation
Ellipsometric Porosimetry: What is it and Where is it Used?
Scanning Probe Microscopy: What is it and Why is it Used
Spectroscopic Ellipsometry: What is it?
Characterising Nanostructures with a Hybrid AFM-SEM System
The Origins and Development of Scanning Probe Microscopy
The DME CompactGranite AFM System
ProberStation 200—A Large Sample AFM System
Spectroscopic Ellipsometer - SE-2000
PDL-1000 Hall Effect Measurement System — AC/DC Field
SE-1000 - Cost-Effective Spectroscopic Ellipsometry for Thin Film Characterization
inSE-1000 - In Situ Spectroscopic Ellipsometer
IND-1500 - Nanoindentation Tester
DME BRR Microscope - Hybrid SEM / AFM
DME Ultra-High Vacuum SPM - Versatile SPM for UHV