Ellipsometers assesses a shift in the polarization of light reflected by or transmitted from a material structure. These devices are often used to discover the optical properties and thickness of a sample. However, they can also determine chemical makeup, crystallinity, roughness, and other material properties related to shifting optical response.
Ellipsometers were initially designed to provide the level of sensitivity needed to gauge nanometer-scale layers used in electronics. Today, it is used in physical sciences, semiconductor and information storage research. This expanded use is related to an ever-increasing dependence on thin films in technology and research.
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