Equipment |Ellipsometers

Ellipsometers

RSS
Ellipsometers assesses a shift in the polarization of light reflected by or transmitted from a material structure. These devices are often used to discover the optical properties and thickness of a sample. However, they can also determine chemical makeup, crystallinity, roughness, and other material properties related to shifting optical response. Ellipsometers were initially designed to provide the level of sensitivity needed to gauge nanometer-scale layers used in electronics. Today, it is used in physical sciences, semiconductor and information storage research. This expanded use is related to an ever-increasing dependence on thin films in technology and research.
Azthena logo

AZoM.com powered by Azthena AI

Your AI Assistant finding answers from trusted AZoM content

Your AI Powered Scientific Assistant

Hi, I'm Azthena, you can trust me to find commercial scientific answers from AZoNetwork.com.

A few things you need to know before we start. Please read and accept to continue.

  • Use of “Azthena” is subject to the terms and conditions of use as set out by OpenAI.
  • Content provided on any AZoNetwork sites are subject to the site Terms & Conditions and Privacy Policy.
  • Large Language Models can make mistakes. Consider checking important information.

Great. Ask your question.

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.