Equipment |Scanning Electron Microscopes (SEM)

Scanning Electron Microscopes (SEM)

A Scanning Electron Microscope uses a targeted beam of high-energy electrons on a test sample to produce an image or detect specific details. Electron-sample interactions can reveal a lot about a sample including its texture, chemical makeup, internal structure and alignment of materials of which the sample is comprised of.

While SEMs are powerful tools, there are some limitations to the technology. Specimens must be solid and fit into the microscope chamber: the width allowed is typically around 10 centimetres and the height limitation is typically 40 millimetres or less. For most SEMs, specimens must be able to withstand a vacuum.

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