EM-30 Series: Tabletop Scanning Electron Microscopes (SEM)

Coxem’s EM-30 Series includes high-resolution tabletop scanning electron microscopes (SEM) that offer unparalleled features and specifications compared to any other SEM in its price range.

Coxem’s EM-30 Series is an ideal, compact SEM, and the companion models of the EM-30AX Series contain integrated EDS elemental micro-analysis.

Three models of the EM-30 Series are:

  • EM-30T —An entry-level model of the EM-30 series, which can be upgraded later
  • EM-30N —This model includes low vacuum mode, integral NavCam, and NEW DSP Imaging Electronics
  • EM-30C —This model is similar to the EM-30N, but includes a CeB6 source (cerium hexaboride or CeBix) in addition

The EM-30 is powered by both BSE and SE detectors, thus enabling users to view either detector separately, side-by-side, or as a composite image for an improved understanding of chemistry and microstructure.

The low vacuum mode enables users to image non-conductive samples without any exclusive pre-treatment. An integrated optical camera helps to control multi-sample holders and streamline navigation using Coxem’s “Macro-Micro-Nano” sample views.

Coxem’s EM-30 series of tabletop scanning electron microscopes are the only ones provided with either CeB6 or tungsten electron sources. Other suppliers are not so equipped to guide users in terms of the most appropriate solution for their applications and laboratory condition. Although the operating cost of tungsten filament sources is low, a CeB6 source provides a brighter image at low kV beam excitation for better signal-to-noise values.

The EM-30 series is driven by NanoStation software and thus effortlessly combines all SEM functions with EDS procedures such as compositional particle analysis and offers cutting-edge image analysis tools such as line profile analysis to exactly define particle size when working at the nanometer scale.

Automated capabilities, such as near-real-time automatic brightness/contrast, streamline operation and help new users to realize consistent results.

An optional STEM detector enables the EM-30 to use its 30 kV accelerating voltage feature to carry out TEM analysis of samples on regular TEM grids. The optional CoolStage allows the examination of samples from −25 °C to 50 °C.


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