|TEM Sample Holders and Supplies
Transmission electron microscopy (TEM) is a process that images nanoscale features of a specimen using a beam of electrons. An image is produced when electrons interact with the sample as they pass through it. The image is then amplified and focused onto an imaging device or medium, such as a photoelectric sensor or layer of film.
There are numerous supplies designed to enhance or facilitate TEM. Grids allow for the identifying points of interest on a specimen. Various support films are designed to improve imaging resolution. Calibration standard ensures that a TEM is working properly. Apertures are used to tune the electron beam.