Equipment |Focused Ion Beam (FIB) Systems & Sources

Focused Ion Beam (FIB) Systems & Sources

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Focused Ion Beam (FIB) systems utilize a finely focused beam of gallium ions operated at low-beam currents for imaging and at high-beam currents for site-specific milling. Their versatility makes them popular for a wide variety of applications including advanced circuit edit, and revealing below-the-surface defects in advanced materials and devices.

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