Equipment |Atomic Force Microscopes (AFM)

Atomic Force Microscopes (AFM)

RSS
Atomic force microscopes (AFM) are one of the most powerful tools for determining surface topography at subnanometer resolution. The technique involves imaging a sample through the use of a probe, or tip, with a radius of 20 nm. The tip is held several nanometers above the surface using a feedback mechanism that measures surface–tip interactions on the scale of nanoNewtons. Variations in tip height are recorded while the tip is scanned repeatedly across the sample, producing a topographic image of the surface.

Request a Quote

for Atomic Force Microscopes (AFM)

Once submitted, we will try and place you in contact with a suitable Atomic Force Microscopes (AFM) supplier within 48 hours.

Request Quote
Request Quote

Other Equipment

Request a Quote

for Atomic Force Microscopes (AFM)

We will try and place you in contact with a suitable supplier within 48 hours.

Request Quote

Terms

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.

Provide Feedback