The Alphacen 300 Flex system is a unique AFM solution capable of easily handling large and heavy samples. It includes the Flex-Mount scan head, a tip-scanner design that enables high-quality imaging independent of sample size or weight.
The CX controller, Nanosurf’s most powerful AFM controller, provides quick and accurate control over the scanning process. The dedicated acoustic cage dampens external noise and vibrations. Furthermore, the system can be adjusted with extra translation or rotation axes to accommodate the individual sample.
Such functionality and versatility are unmatched by any other AFM system.
- The tip scanner design enables high-quality imaging, independent of sample size or weight
- Samples weighing 45 kg and up to 300 mm × 300 mm
- An acoustic enclosure designed to reduce external noise and vibrations
- Can serve as a foundation for customized solutions
Features
Research-Grade Tip-Scanning Design
Image Credit: Nanosurf AG
The Alphacen 300 Flex uses Nanosurf’s FlexAFM’s established research scan head technology to provide high-quality imaging and consistent performance. The scanner's flexure-based tip design enables flat and linear scanning, high resolution, and reliable operation.
Large and Heavy Samples
Image Credit: Nanosurf AG
The Alphacen 300 Flex is a tip-scanning AFM that can handle large and heavy samples without difficulty. This instrument allows users to measure samples up to 300 mm × 300 mm in dimension and 45 kg in weight. The 50 mm z approach stage also allows users to mount bulky samples without difficulty.
AFM System Automation
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In addition to the built-in automation possibilities in the AFM software, the Alphacen 300 Flex system allows users to design automation scripts to meet specific demands. Furthermore, users can automate measurements and integrate the AFM system with a larger automation concept. The Nanosurf Automation Software Solutions team will assist users in transitioning their measuring workflows to Industry 4.0.
Unlimited Freedom with Customization
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The Alphacen 300 Flex is a basic AFM system used as the foundation for a customized solution. Whether users demand accurate sample rotation for consistent feature alignment or sample accommodation beyond 300 mm, the Alphacen 300 Flex can meet their specific needs, thanks to its variable stage system and customizable rotation axes for both the sample positioning system and the scan head.
Alphacen 300 Flex Features
- Simple to use
- Linear and flat scanning
- A wide variety of AFM modes
- Self-aligning cantilevers
- Standard system with customization options
- 24-bit CX Controller
- 100 μm scan range
- Top and sideview cameras
- No sample limitations
Imaging Modes
Alphacen 300 Flex Operating Modes
Standard Imaging Modes
- Static Force Mode
- Lateral Force Mode
- Dynamic Force Mode (Tapping Mode)
- Phase Imaging Mode
Electrical Properties
- Conductive AFM (C-AFM)
- Scanning Spreading Resistance Microscopy (SSRM)
- Piezoelectric Force Microscopy (PFM)
- Electrostatic Force Microscopy (EFM)
- Kelvin Probe Force Microscopy (KPFM)
- Magnetic Force Microscopy (MFM)
Mechanical Properties
- Force Spectroscopy
- Force Modulation
- Force Mapping
- Lithography and Nanomanipulation
- Electrochemical AFM (EC-AFM)
- Scanning Thermal Microscopy (SThM)
Nanosurf C3000 Software
- Developed software solution for all Nanosurf AFM equipment
- Automatic, parameter-free frequency tuning using cantilever characteristics
- Distance and surface roughness measurement tools
- Automatic calibration of deflection sensitivity and Force Spectroscopy wizard
- Novice users can easily learn, and experienced users have complete flexibility
- The instrument control can be entirely scriptable
- Free lifetime updates