Low Temperature AFM with Flexible Temperature Adjustment

Until now, cooling during AFM measurements conducted under ambient conditions has been realized using freezing mixtures or Peltier elements. With these solutions, it is possible to realize temperatures down to -40°C, but not any further.

The JPK CryoStage utilizes liquid nitrogen cooling; it can realize much lower temperatures, down to -120°C and provides the possibility to perform AFM measurements in a cryo-regime, as well as under ambient environments without hindering the AFM resolution and performance. This opens a completely new field of AFM research and applications.

JPK’s CryoStage was created to enable the use of the maximum possible temperature range to offer better flexibility in controlling AFM measurement conditions. AFM imaging and the characterization of nano-mechanical, magnetic, electrical, or other surface properties can now be performed at high and low temperatures, as well as under a gas and ambient atmosphere. In this manner, complete environmental control can be accomplished.

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Specifications

  • Temperature range from -120°C up to 220°C
  • Temperature stability ±0.2°C
  • Sample size extends up to 22 mm x 22 mm
  • Sealed volume with gas flow connection for inert or dry gas across the whole temperature range
  • Reduced vibration for high-resolution imaging of samples Quick cooling rate with liquid nitrogen (>10°C/minute) and nitrogen environment to stop ice formation during cooling
  • Ergonomic LCD touch screen control
  • Fine motion control for precise positioning of the AFM tip relative to the sample of 10 mm x 5 mm
  • Integrated Linkam Scientific Instruments technology
  • TopViewOptics™ illumination without transmission illumination
  • Can be integrated with magnetic, electrical, and nano-mechanical measurement modes

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