RHK’s VT Beetle is based on the field-proven “Johnny Walker” Beetle™ design. It is both thermally and mechanically stable compared to the many SPM designs with varying temperatures that are available on the market today.
The Beetle STM with broad VT operation ranging between 25 K (LHe) and 1500 K, has provided superior quality low current imaging for more than 10 years. Flexible functioning modes along with RHK Technology’s high bandwidth control and low noise electronics provide users with an exceptional STM system package.
The company’s patented tip exchange system enables simple tip exchange with either an optional tip heating module or in-situ tip conditioning on VT systems.
Specifications
The specifications of the Beetle UHV VT STM are as follows:
- Beetle design scans faster than sample scanners due to fewer restrictions on resonant frequency
- High speed scanning: 3 second/frame
- Minimum resolution of 0.5Å (X, Y) and 0.1Å (Z)
- Low current imaging: < 1 pA at 5 kHz bandwidth
- Sample temperatures from 25 K to >1500 K on SPM sample stage and on manipulator stages in preparation/analysis chambers
- Suitable for spectroscopy and extended observation of a specific feature
- Heating samples have no impact on Scan Tube, preventing the risk of affecting its thermal coefficient and causing drift
- Coarse XY positioning no less than 5 mm x 5 mm
- Sample size 10 mm diameter
- Sample holders also available for cleaving; conveying RF signal to sample; and heating in reactive gases via Quartz Bulb or Ceramic Button
- Thermal drift <1 Å/minute
- Inherent mechanical and thermal stability due to small mechanical and thermal loop, inherently stiff and compact Beetle design, and symmetrical geometry
- Sample temperatures: from 25 K (LHe) to >1500 K; or 100 K (LN2) to >1500 K
- Scan range of at least 5 µ x 5 µ XY
- Beetle sample holder uniquely provides true and accurate sample temperature measurement via thermocouple in direct contact with sample itself.
- Sample temperature while imaging: 750 K for AFM, 1000 K for STM
- Six electrical contacts to sample holder (two for heating, two for temperature, two for auxiliary use such as BEEM). A single holder conveniently supports all heating and cooling modes – radiative, e-beam, resistive/DC; LN2 and LHe