HF5000: A Cold Field Emission Transmission Electron Microscope

The HF5000 from Hitachi is a 200 kV aberration-corrected CFE TEM or STEM. It provides a robust blend of atomic-resolution imaging and analysis in combination with extensive automation and sophisticated in-situ capabilities.

Imaging Performance

  • The power of atomic resolution SE imaging can be used with HAADF/ADF/BF in parallel
  • Any user can achieve quality results with the help of the completely automated Cs corrector (or users can take entire manual control whenever they wish to)
  • Field-free imaging of magnetic samples available in TEM and STEM mode
  • Users can make use of Ptychography and 4D STEM to get the most out of their sample

HF5000: A Cold Field Emission Transmission Electron Microscope

Image Credit: Hitachi High-Tech Europe

Analytical Performance

  • Maximum EELS performance provided with the help of high brightness, narrow-energy CFE gun
  • High throughput, high sensitivity EDX available with symmetrically opposed dual SDDs offering >2 sr collection angle

HF5000: A Cold Field Emission Transmission Electron Microscope

Image Credit: Hitachi High-Tech Europe

Powerful Automation

  • Users can program their workflows and recipes in Python for regular tasks, tomography, high speed acquisition, or the most complicated in-situ experiments
  • Users have the option to combine multi-platform control systems and datasets into an individual timeline with the help of Azorus open-source software

Advanced In-Situ Capabilities

  • Users can carry out in-situ and operando experiments with gas, liquid, heating, biasing and electrochemistry holders
  • Customized holder design service guarantees that users can perform precisely the experiment they require
  • Users can view in-situ reactions of gases with surfaces by utilizing the SE detector

HF5000: A Cold Field Emission Transmission Electron Microscope

Image Credit: Hitachi High-Tech Europe

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