PiFM and its Role in Nanoscale Chemical Imaging Derek Nowak & Beihang Yu PiFM combines atomic force microscopy with chemical imaging, offering insights into molecular orientation and surface chemistry at the nanometer scale.
Conversations on AFM: How AI is Automating Scanning Probe Microscopy Prof. Dr. Sergei Kalinin AI advancements in microscopy are reshaping electromechanical measurements, streamlining automated experimentation and driving innovation in materials research.
Breaking Barriers in Thin-Film Deposition with ATLANT 3D’s DALP Technology Mira Baraket Discover how ATLANT 3D's DALP technology revolutionizes thin-film deposition, enabling rapid prototyping and advanced material applications in nanofabrication.
Vista 200 for Nano-Chemical Analysis with Sub-5 nm ResolutionLearn more about the Vista 200 and how it delivers precise nano-chemical analysis with sub-5 nm resolution and stability. From Molecular Vista
Dimension Nexus AFM: For High-Resolution Metrology in R&DDiscover how the Dimension Nexus AFM delivers high-resolution metrology for R&D, with advanced automation and large-sample capabilities. From Bruker Nano Surfaces and Metrology
Premier 300 mm AFM with the Park FX300The Park FX300 is designed to break the boundaries between research and industrial applications, making it a game-changer in AFM. From Park Systems
Different DLS-Based Systems Can Give Us Different Size Results, and All of Them Can Be correct! From InProcess-LSP 27 May 2025
Next Generation Magnetic Force Microscopy with PeakForce Probes From Bruker Nano Surfaces and Metrology 16 May 2025