Videos | MRS 2011 Fall Meeting Video Interviews

MRS 2011 Fall Meeting Video Interviews Videos

MRS 2011 Fall Meeting Video Interviews Videos

Demonstration of miBot Nanomanipulators by Imina Technologies

If you ned to manipulate samples, devices or biological materials in light microscopes, electron microscopes or FIB's, or if tweezers are not suitable, then you should consider miBots by Imina Technologies. These nanomanipulators can operate over large areas untethered and are to work under vacuum conditions.

The Leica TXP and TIC 3X Sample Preparation Systems

Todd Perez from Leica shows us their sample preparation system that consists of 2 instruments, the TXP mechanical preparation system and the TIC 3X triple ion beam cutting system.

The NX10 AFM from Park Systems - The World's Most Accurate Atomic Force Microscope

Mark Cyffka from Park Systems shows us their all new NX10 AFM (atomic force microscope) which went on show for the first time at the 2011 MRS Fall Meeting in Boston. The NX10 is the most accurate AFM in the world and Mark points out the main features that have contributed to this.

The AFM+ Platform from Anasys Instruments

At this year's MRS Fall meeting Anasys Instruments displayed their new AFM+ platform that combines an atomic force microscope and thermal analysis capabilities. This platform was designed to be upgraded to their NanoIR spec at a later date.

The Dimension Fastscan from Bruker - The Fastest AFM on the Market

John Thornton from Bruker takes us for a tour of the Dimension Fastscan atomic force microscope AFM. This instruments' claim to fame is that it is the fastest AFM on the market. It's speed and ability to scan samples at a rapid rate without sacrificing resolution, combined with 300mm sample chuck, make it ideally suited production environments.

Leica's DCM 3D Surface Metrology Tool

The DCM 3D surface metrology tool from Leica features a confocal microscope and interferometer with LED illumination and CCD detector. The interferometer and confocal microscope have resolutions of 0.1nm and 3.5nm respectively.

The Bruker Innova-IRIS AFM-Raman System

Stefan Kaemmer from Bruker gave a tour of their new Innova-Iris syste. This instrument combines the Bruker AFM platform with Renishaw's raman confocal microscope and allows the user to correlate chemical and topographical information at the same time.

Customised Nanoparticles and Dispersions from Nanograde

If you are looking for nanoparticles or nanoparticle dispersions to suit a particular requirement, you should consider speaking to Sam Halim, CEO of Nanograde. As you will see in this interview, they can prepare customised nanomaterials to your specifications and ship them wherever you are in the world

The SOLVER Nano Atomic Force microscope from NT-MDT

As has been their tradition, NT-MDT have launched another new product at the MRS Fall Meeting held in Boston. This year they launched the SOLVER Nano AFM (atomic force microscope).

The KLA Tencor P-6 Stylus Profilometer

Brian Crawford shows us the P-6 Profilometer by KLA Tencor and demonstrates its operation. The instrument features a 156mm sample stage that is motorized to move in x and y axes as well as rotation.

The FluidFM by Nanosurf

The FluidFM is a new product from Nanosurf based on their Flex AFM system. It is a new technology designed for life science and pharmaceutical applications. It uses nanofluidic cantilevers with a channel, which allows the user to to extract or inject fluids.

Optical Profiler - The ContourGT-X8 from Bruker

Eric Rufe from Bruker Nano Surfaces shows us their ContourGT-X8 optical profiler. It is effectively a 3-dimensional microscope and features the 10th generation of this technology.

The NanoTest Vantage Nanomechanical Testing System from Micro Materials

The NanoTest Vantage is Micro Materials latest nanomechanical testing system. It can perform a number of tests that are briefly described in this interview.

The Evactron Plasma Decontaminator

XEI Scientific manufacture the Evactron plasma decontamination systems. Tom Levesque explains how they can be used as a benchtop unit or on instruments such as scanning electron microscopes (SEM), transmission electron microscopes (TEM) or focused ion beam systems (FIB). In these applications they can be used to clean samples or chambers, removing organic contaminants or hydrocarbon residues.

The MicroXAM 100 Surface Profilometer and Optical Interferometer from KLA Tencor

Jim Zobel from KLA Tencor demonstrates their MicroXAM 100 surface profilometer and white light optical interferometer. The MicroXam 100 features fast data acquisition rates that enable calculation of such things as surface roughness, step heights and other surface features.

The Benefits of Including Floor Vibration Control for Nano-Tech Facilities over Designing ‘Quiet’ Buildings

Steve Ryan

In this interview Steve Ryan explains importance of adding vibration isolation and floor vibration control to Nano-Tech Facilities.

The Benefits of Including Floor Vibration Control for Nano-Tech Facilities over Designing ‘Quiet’ Buildings

Quantum Dot Technology In the Display Industry

Samuel Halim

Samuel Halim, CEO and founder of Avantama AG, talks to AZoNano about the advances in quantum dot technology for the display industry.

Quantum Dot Technology In the Display Industry

Pushing the Boundaries of TEM Research with the Poseidon Select

Dr. Madeline J. Dukes

DR. Madeline J. Dukes, an Application Scientist from Protochips talks to AZoNano about their range of products, that are pushing the boundaries for laboratories who in the past where challenged when it came to in situ TEM tools.

Pushing the Boundaries of TEM Research with the Poseidon Select

Next Generation STACIS Active Piezoelectric Vibration Cancellation - SEM-Base VI for SEMs

Next Generation STACIS Active Piezoelectric Vibration Cancellation - SEM-Base VI for SEMs

SEM-Base® VI is considered to be the next generation in STACIS active piezoelectric vibration cancellation. The design of the SEM-Base VI allows it to support all commercial Scanning Electron Microscopes (SEMs), and also many Small Dual Beam and Focused Ion Beam (FIB) instruments.

From Technical Manufacturing Corporation Vibration Control

eLINE Plus: Ultra High Resolution Electron Beam Lithography, Nanoengineering and Imaging

eLINE Plus: Ultra High Resolution Electron Beam Lithography, Nanoengineering and Imaging

The eLINE Plus from Raith is the optimum, extensively distributed system for Research Centers and Universities that want to integrate an Electron Beam Lithography system with an open platform for additional optional nanofabrication processes and methods in a single tool.

From Raith

Park NX-Bio AFM: Powerful Nanoscale Microscopy for Life Science

Park NX-Bio AFM: Powerful Nanoscale Microscopy for Life Science

A Life Scientist wants to be able to see how biological materials look like at nanoscale resolution and how soft they are in buffer and liquid conditions. The Park NX-Bio enables that with its highly acclaimed Atomic Force Microscopy (AFM) technology and its innovative in-liquid imaging Scanning Ion Conductance Microscopy (SICM).

From Park Systems Inc