Videos | MRS 2011 Fall Meeting Video Interviews

MRS 2011 Fall Meeting Video Interviews Videos

MRS 2011 Fall Meeting Video Interviews Videos

The Bruker Innova-IRIS AFM-Raman System

Stefan Kaemmer from Bruker gave a tour of their new Innova-Iris syste AFM-Raman System.

The Dimension Fastscan from Bruker - The Fastest AFM on the Market

John Thornton from Bruker takes us for a tour of the Dimension Fastscan atomic force microscope AFM.

Optical Profiler - The ContourGT-X8 from Bruker

Eric Rufe from Bruker Nano Surfaces shows us their ContourGT-X8 optical profiler. It is effectively a 3-dimensional microscope and features the 10th generation of this technology.

The Evactron Plasma Decontaminator

XEI Scientific manufactures the Evactron plasma decontamination systems.

Leica's DCM 3D Surface Metrology Tool

The DCM 3D surface metrology tool from Leica features a confocal microscope and interferometer with LED illumination and CCD detector. The interferometer and confocal microscope have resolutions of 0.1nm and 3.5nm respectively.

The NX10 AFM from Park Systems - The World's Most Accurate Atomic Force Microscope

Mark Cyffka from Park Systems shows us their all new NX10 AFM (atomic force microscope) which went on show for the first time at the 2011 MRS Fall Meeting in Boston. The NX10 is the most accurate AFM in the world and Mark points out the main features that have contributed to this.

The Leica TXP and TIC 3X Sample Preparation Systems

Todd Perez from Leica shows us their sample preparation systems that consists of 2 instruments, the TXP mechanical preparation system and the TIC 3X triple ion beam cutting system.
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