MRS 2011 Fall Meeting Video Interviews Videos

John Thornton from Bruker takes us for a tour of the Dimension Fastscan atomic force microscope AFM.

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Stefan Kaemmer from Bruker gave a tour of their new Innova-Iris syste.

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Todd Perez from Leica shows us their sample preparation system that consists of 2 instruments, the TXP mechanical preparation system and the TIC 3X triple ion beam cutting system.

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The FluidFM is a new product from Nanosurf based on their Flex AFM system. It is a new technology designed for life science and pharmaceutical applications. It uses nanofluidic cantilevers with a channel, which allows the user to to extract or inject fluids.

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Eric Rufe from Bruker Nano Surfaces shows us their ContourGT-X8 optical profiler. It is effectively a 3-dimensional microscope and features the 10th generation of this technology.

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XEI Scientific manufactures the Evactron plasma decontamination systems.

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Mark Cyffka from Park Systems shows us their all new NX10 AFM (atomic force microscope) which went on show for the first time at the 2011 MRS Fall Meeting in Boston. The NX10 is the most accurate AFM in the world and Mark points out the main features that have contributed to this.

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The DCM 3D surface metrology tool from Leica features a confocal microscope and interferometer with LED illumination and CCD detector. The interferometer and confocal microscope have resolutions of 0.1nm and 3.5nm respectively.

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