Videos | MRS 2011 Fall Meeting Video Interviews

MRS 2011 Fall Meeting Video Interviews Videos

MRS 2011 Fall Meeting Video Interviews Videos

The Leica TXP and TIC 3X Sample Preparation Systems

Todd Perez from Leica shows us their sample preparation systems that consists of 2 instruments, the TXP mechanical preparation system and the TIC 3X triple ion beam cutting system.

The Evactron Plasma Decontaminator

XEI Scientific manufactures the Evactron plasma decontamination systems.

The Dimension Fastscan from Bruker - The Fastest AFM on the Market

John Thornton from Bruker takes us for a tour of the Dimension Fastscan atomic force microscope AFM.

Leica's DCM 3D Surface Metrology Tool

The DCM 3D surface metrology tool from Leica features a confocal microscope and interferometer with LED illumination and CCD detector. The interferometer and confocal microscope have resolutions of 0.1nm and 3.5nm respectively.

The Bruker Innova-IRIS AFM-Raman System

Stefan Kaemmer from Bruker gave a tour of their new Innova-Iris syste AFM-Raman System.

Optical Profiler - The ContourGT-X8 from Bruker

Eric Rufe from Bruker Nano Surfaces shows us their ContourGT-X8 optical profiler. It is effectively a 3-dimensional microscope and features the 10th generation of this technology.

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