Videos | MRS 2011 Fall Meeting Video Interviews

MRS 2011 Fall Meeting Video Interviews Videos

MRS 2011 Fall Meeting Video Interviews Videos

The Bruker Innova-IRIS AFM-Raman System

Stefan Kaemmer from Bruker gave a tour of their new Innova-Iris syste AFM-Raman System.

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The Leica TXP and TIC 3X Sample Preparation Systems

Todd Perez from Leica shows us their sample preparation systems that consists of 2 instruments, the TXP mechanical preparation system and the TIC 3X triple ion beam cutting system.

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The Dimension Fastscan from Bruker - The Fastest AFM on the Market

John Thornton from Bruker takes us for a tour of the Dimension Fastscan atomic force microscope AFM.

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The Evactron Plasma Decontaminator

XEI Scientific manufactures the Evactron plasma decontamination systems.

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Leica's DCM 3D Surface Metrology Tool

The DCM 3D surface metrology tool from Leica features a confocal microscope and interferometer with LED illumination and CCD detector. The interferometer and confocal microscope have resolutions of 0.1nm and 3.5nm respectively.

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Optical Profiler - The ContourGT-X8 from Bruker

Eric Rufe from Bruker Nano Surfaces shows us their ContourGT-X8 optical profiler. It is effectively a 3-dimensional microscope and features the 10th generation of this technology.

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