alpha300 Raman/AFM/SNOM from WITec - Features and Applications

Jo Koenen from WITec shows us through the alpha300 Raman/AFM/SNOM from WITec.

The WITec microscopy series features scanning probe as well as high resolution optical and Raman microscopy techniques in either a single instrument or combined system configurations for the highest flexibility throughout a wide range of microscopy applications.

For example, it is possible to start with Confocal Raman Microscopy and upgrade later to Atomic Force Microscopy or vice versa. With such a combined instrument, chemical information can be directly linked to structural AFM information from the same sample area using only one instrument. For high-resolution optical information, the system can even be equipped with SNOM capabilities.

Run time: 8.36 mins