Neos AFM from Bruker AXS - Features and Applications
Dave Sampson from
AXS shows us through the N8 NEOS atomic force microscope from Bruker AXS
The N8 NEOS combines optical microscopy and Scanning Probe Microscopy in a
single, optimized set - up. The combination of the NANOS AFM / SPM and a high
power optical microscope on a highly rigid granite stand makes the N8 NEOS a
highly effective and exceptionally versatile inspection system.
Due to its proprietary, sturdy design, the SPM performance reaches down to
an atomic resolution level. Using a strong, yet extremely precise vertical motion
stage allows to measure even on very heavy and large samples. The N8 NEOS can
be easily adapted to special requirements and customers wishes: from manually
positioning to high precision joystick automatization, from liquid cell observation
on biological tissue to the industrialized inspection in quality control. All
AFM/SPM modes and optical contrast techniques are available, making the N8 NEOS
the ideal inspection tool where the ultimate performance is required.
Run time: 2.48 mins