Posted in | Pittcon 2009 Video Interviews

Neos AFM from Bruker AXS - Features and Applications

Dave Sampson from Bruker AXS shows us through the N8 NEOS atomic force microscope from Bruker AXS

The N8 NEOS combines optical microscopy and Scanning Probe Microscopy in a single, optimized set - up. The combination of the NANOS AFM / SPM and a high power optical microscope on a highly rigid granite stand makes the N8 NEOS a highly effective and exceptionally versatile inspection system.

Due to its proprietary, sturdy design, the SPM performance reaches down to an atomic resolution level. Using a strong, yet extremely precise vertical motion stage allows to measure even on very heavy and large samples. The N8 NEOS can be easily adapted to special requirements and customers' wishes: from manually positioning to high precision joystick automatization, from liquid cell observation on biological tissue to the industrialized inspection in quality control. All AFM/SPM modes and optical contrast techniques are available, making the N8 NEOS the ideal inspection tool where the ultimate performance is required.

Run time: 2.48 mins

Bruker Neos AFM

 

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