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XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems.
XEI manufactures and sells the Evactron® De-Contaminator, which removes hydrocarbon contamination from SEMs, FIBs and other vacuum systems. It has been described by one of our users as the only accessory you can buy for the SEM that will improve the performance of the instrument.
Serial Block-Face Scanning Electron Microscopy: How to Improve Image Quality
Hydrocarbon Mitigation: How to Improve Remote Plasma Cleaning
Electron Beam Induced Contamination: How to Achieve Active Monitoring and Control
Plasma Cleaning on X-Ray Windows: The Effects
Why Optimal TKD and EBSD Results Require Evactron® Plasma Cleaning
SEM Plasma Cleaning Equipment and the Use of Oxygen
University of Puerto Rico and NASA Back in the News – XEI Reports
XEI Scientific Partners with Electron Microscopy Sciences to Promote and Sell its Products in North and South America
XEI Scientific and the University of Southern California Collaborate on the Use of Downstream Plasma Cleaning in Sample Preparation and Publish a Paper in ACS Photonics
XEI Scientific Releases Evactron ES Decontamination System at Microscopy & Microanalysis Meeting
XEI Scientific Awarded US Patent for New TEM Stage Loader
XEI Scientific Appoint Eclipse Technologies as Northwest USA Distributors
XEI Scientific Announce Distribution Deal with ICMAS in Southeast USA
XEI Scientific Receive Patent for their Oxidative Cleaning Method for SEM and High-Vacuum Equipment
GE Global Research Center and XEI Scientific Publish Paper on In-Situ Plasma Cleaning with EVACTRON Systems
M&M 2013 Launch Of Zephyr™ Cleaning Technology From XEI Scientific
XEI Scientific Announce China Distribution Deal with Yi Xin Technology
UCL School of Pharmacy Use Evactron Plasma Technology for SEM Chamber Cleaning
XEI Awarded Patent for Their Scientific Plasma Cleaning TEM Wand
XEI Scientific Evactron Plasma Cleaning System Used by RJ Lee Group for Specimen Cleaning
XEI Scientific's Evactron Specimen Cleaning Technology Employed by NanoLab Technologies
New System for Column Cleaning and Parts Decontamination for Microscopes
New SoftClean Specimen Cleaning Chamber from XEI Scientific
Evactron Decontaminator Cleans Carbon Contamination with Hydrogen
XEI Scientific 1000th Evactron Plasma Cleaning System
The Evactron Plasma Decontaminator
Evactron ES De-Contaminator: Vacuum Chamber Cleaning System for TESCAN SEM/FIB
Evactron® E50 and E50 E-TC: Plasma De-Contaminators
Evactron® U50: Plasma De-Contaminator for UHV Chambers
Evactron® E50: Plasma De-Contaminators with Alternate Gas Configuration
Evactron® 25Z Zephyr De-Contaminator from XEI Scientific for Vacuum Chamber Cleaning
Evactron® SoftClean Desktop Plasma Cleaning Sample Chamber