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The EM TIC 3X Milling System surpasses conventional slope cutting instruments. It can mill at high rates, cut broad and deep into the sample, and create smooth surfaces resulting in high-quality cross-sections of almost any material, quickly and easily. Run-time 4:19mins
The Leica TXP and TIC 3X Sample Preparation Systems
Leica's DCM 3D Surface Metrology Tool
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