Applied Nanostructures Silicon Probes are available in different configurations such as long and short cantilever for tapping and non-contact mode applications, multi-cantilever probes for force calibration, probes for force modulation microscopy, probes for contact applications and probes with varying degrees of tilt compensation.
- Direct optical view of the AFM tip
- Tapping, contact and non-contact mode applications
- Spring constant calibration of SPM probes
- Force Modulation Microscopy
- Imaging or Trench Depth Metrology.