Applied Nanostructures Silicon Probes

Applied Nanostructures Silicon Probes are available in different configurations such as long and short cantilever for tapping and non-contact mode applications, multi-cantilever probes for force calibration, probes for force modulation microscopy, probes for contact applications and probes with varying degrees of tilt compensation.


  • Direct optical view of the AFM tip
  • Tapping, contact and non-contact mode applications
  • Spring constant calibration of SPM probes
  • Force Modulation Microscopy
  • Imaging or Trench Depth Metrology.

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