Applied Nanostructures Silicon Probes

Applied Nanostructures Silicon Probes are available in different configurations such as long and short cantilever for tapping and non-contact mode applications, multi-cantilever probes for force calibration, probes for force modulation microscopy, probes for contact applications and probes with varying degrees of tilt compensation.


  • Direct optical view of the AFM tip
  • Tapping, contact and non-contact mode applications
  • Spring constant calibration of SPM probes
  • Force Modulation Microscopy
  • Imaging or Trench Depth Metrology.

Other Equipment by this Supplier

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.