Nanostructures Silicon Probes are available in different configurations
such as long and short cantilever for tapping and non-contact mode applications,
multi-cantilever probes for force calibration, probes for force modulation microscopy,
probes for contact applications and probes with varying degrees of tilt compensation.
Applications of Applied
Nanostructures Silicon Probes include:
- Direct optical view of the AFM tip
- Tapping, contact and non-contact mode applications
- Spring constant calibration of SPM probes
- Force Modulation Microscopy
- Imaging or Trench Depth Metrology.