Physik Instrumente (PI), a global leader in photonics, piezo and nanopositioning technologies, highlights its P-733 XY piezo scanning stage as a high-performance solution for applications that demand ultrafast, nanometer-precise motion, including image stabilization, pixel-shift imaging, and resolution enhancement. The P-733.2 provides travel ranges to 100 µm × 100 µm, resolution to 0.1 nm with capacitive sensors, a zero-play flexure guidance system, and a 50 mm × 50 mm clear aperture for transmitted-light applications. PI also offers the P-733.3 XYZ version for applications that require an additional Z axis.
PI’s nanometer-precise P-733 XY scanning stage supports image stabilization, pixel shifting, and super-resolution microscopy. Image Credit: PI (Physik Instrumente) LP
Piezo scanning stages are increasingly used in advanced optical and imaging and laser systems to compensate for vibration and motion in real time and to execute precise sub-pixel shifts of an image sensor, focal plane array or optical component. This enables multiple offset images to be captured and digitally combined, improving sharpness and increasing effective resolution beyond the native pixel grid. PI notes that fast piezo scanners can operate at video frequencies and cover the small motion ranges required between adjacent pixels, making them well suited for shake suppression, microscanning, and super-resolution imaging. Piezo scanners are also used to improve the performance of laser micro hole drilling systems. With high dynamics, parallel kinematics, and direct position feedback for active error compensation, the P-733 platform is designed for demanding industrial and scientific imaging and laser applications where speed, repeatability, and precision are critical.
Industries & Applications Served
Aerospace, photonics, semiconductors, optics, microscopy, astronomy, image stabilization, laser-beam stabilization, image resolution enhancement, nanopositioning