Secondary Ionization Mass Spectrometry (SIMS) is an effective method for high-resolution chemical imaging and direct investigation of solid materials. SIMS provides highly sensitive elemental and isotopic information at micro- to nanoscale precision by sputtering a surface with a concentrated ion beam and examining the resulting ions.
This on-demand webinar introduces TOFWERK's fibTOF time-of-flight (TOF) mass analyzer, which is designed to work seamlessly with leading FIB-SEM platforms.
The fibTOF provides exact mass separation, excellent sensitivity, and nanometer-scale spatial resolution, enabling localized chemical analysis and comprehensive 3D dataset generation with a mass spectrum for each voxel.
Webinar Highlights
This on-demand webinar discusses:
- A summary of SIMS and fibTOF measuring principles
- Key performance metrics and advantages of TOF mass analysis
- Synchronized SIMS and FIB scanning for 3D chemical imaging
- Example applications, such as semiconductors, batteries, and advanced materials
Presenter
Dr. Valentine Riedo-Grimaudo is a fibTOF application scientist at TOFWERK in Thun, Switzerland. The fibTOF is a SIMS instrument designed for FIB-SEM microscopes. Valentine has vast experience analyzing the microchemical composition of complex solid materials with time-of-flight mass spectrometry.
She contributes to the advancement of this technology by designing and conducting experiments for use-case and solution development, as well as supporting OEM partners with demonstrations, sales, and marketing campaigns.