The ZEISS Xradia 800 Ultra X-ray microscope achieves spatial resolution down to 50 nm, the highest among lab-based X-ray imaging systems. Unparalleled performance in an ultra-high resolution lab-based system can be achieved using non-destructive 3D imaging, which plays a significant role in today’s breakthrough research.
The innovative Xradia Ultra architecture features X-ray energy of 8 keV and absorption and phase contrast imaging modes, using optics adapted from the synchrotron. Xradia 800 Ultra helps to accomplish unrivaled in situ and 4D capabilities essential for analyzing material evolution over time.
The limits of X-ray imaging used in diverse industrial applications, natural resources, life sciences and materials science are extended by Xradia 800 Ultra.
Xradia 800 Ultra has a resolution as fine as 50 nm, which provides insight into microscopic structures and processes that were earlier not accessible with standard lab-based X-ray technology. Operating with 8 keV X-rays provides outstanding penetration and contrast for a variety of materials, enabling users to observe structures and materials in their natural state.
The Zernike method is employed by ZEISS integrated phase contrast technology, which enhances the visibility of grain boundaries and material interfaces when absorption contrast is low, providing users with visibility of ultra- and nano-structures without staining.
Reliable internal 3D information, otherwise only accessible with destructive methods such as cross-sectioning, is delivered by ZEISS Xradia 800 Ultra. In situ studies can be performed with ease through the atmospheric sample environment and large working distance.
- Now with Scout-and-Scan Control System with an easy workflow-based user interface, suitable for the central imaging lab where users may have a wide range of experience levels
- Develop, prepare and test planned synchrotron experiments in the laboratory to increase the efficiency of limited availability of synchrotron beam time
- Non-destructive 3D X-ray imaging allows repeated imaging of the same sample enabling direct observation of microstructural evolution
- Absorption and Zernike phase contrast imaging modes
- Switchable field-of-view ranging from 15 to 60 µm
- Automated image alignment for tomographic reconstruction
- High resolution down to 50 nm is maintained for imaging of samples within in situ devices
ZEISS Xradia 800 Ultra Non-Destructive 3D Imaging System
Crack Propagation and Fracture in Dentin