Posted in | X-Ray Diffractometers

Xeuss 3.0 X-ray Scattering Beamline for Laboratory Applications

Xenocs’ Xeuss 3.0 is the next generation X-ray scattering laboratory beamline for the characterization of nanostructured materials. It uses Small Angle and Wide Angle X-ray Scattering (SAXS/WAXS) in both sample transmission or grazing incidence (GI) to collect structural information at both the atomic and nanoscale. Optional Ultra Small Angle X-ray Scattering (USAXS) extends the characterization scale to few microns sized structures.

(GI-)SAXS/WAXS/USAXS beamline for the laboratory

Benefiting from 20 years of innovation and more than 10 years of customer experience on in-vacuum motorized detector travel technology and on Xeuss SAXS systems, the Xeuss 3.0 is the next generation beamline for your lab:

Maximum flexibility – Measuring capability of sample structures from atomic scale up to a few microns is achieved through entirely motorized changes of instrument configurations providing structural tools to a large community of users with full remote operation and high throughput.

Unique measuring performance – Xeuss 3.0 offers excellent data quality both in terms of detectable Q-range, high signal to noise and absolute intensity accuracy. Improved measurement quality is achieved by using best in class sources, optics, detectors and long-travel Q-Xoom moving detectors.  

Plenty of space for sample environments –Not having to move sample to change instrument resolution, Xeuss 3.0 enables unique space and freedom at sample area offering openness for future needs.

Multi-application instrument

The Xeuss 3.0 is a multi-application instrument that could be used to characterize a large variety of materials such as block or semicrystalline polymers, colloids, nanoparticles, proteins in solutions, alloys. Xeuss 3.0 is delivered with a powerful software suite including Xenocs XSACT data analysis software providing extensive algorithms together with high user experience.

Example of measuring parameters and applications include:

  • Crystalline fraction and lamellar structure for semicrystalline polymers
  • Size distribution of particles in dispersions or powders from few nanometers to few hundred nanometers
  • Phase analysis for mesoporous systems or liquid crystals
  • Orientation of structures in stretched polymers
  • Molecular weight of proteins or polymers diluted in solution
  • Size and shape of nano-objects
  • Dynamic analysis of nanostructure depending on temperature, humidity, tensile, shear

Key features and benefits

The Xeuss 3.0 offers a maximum flexibility of measurement configurations with high level of automation in data acquisition to get the best possible data quality on any type of sample. Key features include:

  • Q-Xoom in-vacuum moving detector with long travel
  • Motorized multi-energy source to adapt to sample absorption
  • Motorized Bonse-Hart USAXS and movable WAXS additional detector
  • Beamstop-free data acquisition for highly accurate and high dynamic range data
  • Very large surface of detection for anisotropic samples or optimized resolution
  • Clean beam technology providing high intensity and low background
  • Very large vacuum chamber with large free space at sample

Field of research

Xeuss 3.0 is an ideal shared characterization facility instrument that will equally satisfy x-ray scattering experts or material scientist in various field of research:

  • Nanoparticles & colloids
  • Structural Biology
  • Polymer research
  • Oil & gas
  • Food science
  • Cosmetics & consumer care
  • Renewable energy
  • Inorganic materials

Please visit Xenocs website for more information on SAXS applications.

Xeuss 3.0 Beamline for Laboratory Applications

Motorized multi-energy source
Long travel in-vacuum motorized SAXS detector
Free space for sample with all the way motorized detectors

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