QUADRO Detector Series from DECTRIS

The latest QUADRO detector introduced by DECTRIS has been developed to offer excellent performance to materials science Transmission Electron Microscopy (TEM) without impacting sensitivity, speed, or precision. It delivers up to 18,000 frames/second readout and 24-bit high dynamic range, without binning or gimmicks!

The QUADRO detector is powered by DECTRIS’ latest EIGER2 ASIC (Application Specific Integrated Circuit), fully developed by the company. It includes everything which made DECTRIS’ detectors perfect for the most challenging X-ray applications — continuous readout, hybrid pixel technology, instant retrigger, and noise-free acquisition.

The QUADRO is a direct electron detector that uses hybrid pixel technology in which the finest readout chip is matched with the most appropriate sensor material to offer improved sensitivity (DQE) for users’ applications.

In addition, dedicated in-pixel electronics enable single electron counting even at extremely high count-rates, that is, up to 10 million electrons/pixel/second. Users can adjust the sensor material according to the energy range of their applications. The QUADRO comes with CdTe for mid-to-high-energy electrons (120–300 kV) or a silicon sensor for low energies (30–200 kV).

The DECTRIS QUADRO detector can be used with the SerialEM program and an array of transmission electron microscopes. It is fully incorporated into NanoMegas' TopSpin application.

Orientation Mapping with an Aluminum sample

Orientation mapping results from diffraction patterns acquired with QUADRO.

Figure 1. Orientation mapping results from diffraction patterns acquired with QUADRO. From left to right: Color-coded orientation map with grain boundaries, orientation reliability map, and index map. Image Credit: DECTRIS.

Key Advantages

  • No dead time
  • Up to 18,000 frames/second
  • 107 counts/pixel/second
  • Region of interest feature
  • Direct detection of electrons
  • Optimal DQE even at low energies
  • Noise-free electron counting
  • Beam stop is not needed

Applications

  • Lorentz, magnetic mapping
  • Strain mapping
  • Dynamic TEM
  • In-situ TEM
  • 4D-STEM
  • Ptychography
  • Electron diffraction

QUADRO Specifications

Table 1. Source: DECTRIS

. .
Pixel size [µm²] 75 x 75
Number of pixels 514 x 514
Active area, width x height [mm²] 38.6 x 38.6
Energy range [keV] 30 - 300
Maximum frame rate, ROI [Hz] 18'000
Maximum frame rate, full frame [Hz] 2'250 (16-bit), 4'500 (8-bit)
Sensor Si or CdTe
Data format HDF5
Cooling Water, 20 °C
Dimensions (WHD) [mm³] 200 x 350 x 200
Detective Quantum Efficiency, DQE(0) 0.99 @ 100 kV; 0.96 @ 200 kV
Detector mounting Bottom, on-axis
Radiation hardness [el./mm²] >5 x 1015

 

All specifications are subject to change without notice.

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