JEM-1400Flash: Advanced Transmission Electron Microscope

JEOL's JEM-1400 series 120 kV Transmission Electron Microscope is well known for its user-friendliness and ability to provide high-resolution imaging and analysis. Numerous fields employ it, including biology, pathology, polymers, nanotechnology, quality control, and materials development.

Launched in 2017, the JEM-1400Flash is based on the immensely popular JEM-1400(Plus). It allows the user to view the samples at low magnification and then analyze the fine structures of interest at a higher magnification.

The JEM-1400Flash's integrated high-sensitivity sCMOS camera, optical microscope (OM) image linkage function, and ultra-wide area montage system facilitate a seamless transition between low and high magnification, enabling the acquisition of higher-throughput image data.

In addition to helping to boost throughput, the JEM-1400Flash's TMP creates an oil-free column vacuum and permits instantaneous sample exchanges.

The JEM-1400Flash delivers outstanding S/TEM analytical performance, including 3D tomography, high-resolution/high-contrast imaging, elemental mapping with the latest large-area SDD detectors, montaging, and cryo-microscopy.

The JEM-1400Flash is a small, easy-to-use TEM that offers STEM images (BF/DF) on the default GUI and supports optional STEM digital imaging/scanning circuitry.

Below is a list of some of the JEM-1400Flash's new features.

High-Sensitivity sCMOS Camera, “Matataki Flash” Camera

JEOL's new high-sensitivity sCMOS camera, dubbed "Matataki Flash," has a high frame rate and significantly reduces readout noise. This reliable feature makes obtaining very low noise and high throughput TEM images possible.

Ultra-Wide Area Montage System, Limitless Panorama (LLP)

In addition to the conventional electromagnetic image shift, the JEM-1400Flash has a montage system that can move the field of view using the stage drive. With the help of this innovative system, an infinitely large montage panorama image can be taken.

In the case of a grid-sized montage, an image with an ultra-wide area and high pixel resolution can thus be obtained and used to navigate the entire grid. Obtaining an infinite number of frames is made possible by the "Limited Panorama" option.

Picture Overlay (OM Image Linkage Function)

One can overlay a digital image captured with an OM on a TEM image in Correlative Light and Electron Microscopy (CLEM) workflows. This technique combines high-resolution structural data from a TEM with spatiotemporal information from a fluorescence light microscope.

Consequently, the knowledge that CLEM bridges between structural biology and cells can be expanded to include the integrated use of high-resolution markers for more precise targeting of pertinent fluorescence loci.

New User Interface

In addition to a fresh coat of paint, new designs are employed for (1) knob sets with user-definable OLED-equipped buttons for easy-to-view operation; (2) a touchscreen for user-friendly operation; and (3) a new Graphical User Interface. The new JEM-1400Flash is fully compatible with tomography and SPA workflows using SerialEM.

Key Features

  • Automated tomography from several points
  • Limitless Panorama ultra-wide area montaging
  • Simplified GUI, including a multi-touch screen for ultimate ease of use
  • Compact footprint
  • LaB6 emitter standard
  • A tilt of +/−70° with support for dual-axis tomography
  • Data viewing and remote operation for collaboration
  • 5-axis Microactive Goniometer supports cryo-holders
  • Improved high-contrast imaging for materials science, low Z, and biological applications
  • TMP with instantaneous sample exchange
  • Large area SDD-EDS and STEM available

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