Research have announced that Asylum's MFP-3D™ NanoIndenter has
been selected as one of the top five products exhibited at the AVS International
Symposium in October. Asylum's MFP NanoIndenter is a true "instrumented"
indenter and is the first AFM-based indenter that does not use cantilevers as
part of the indenting mechanism. These characteristics and the use of state-of-the-art
AFM sensors provide substantial advantages in accuracy, precision and sensitivity
over other nanoindenting systems. Unlike cantilever indenters, the MFP NanoIndenter
drives the indenting tip perpendicular to the surface. This vertical drive avoids
the lateral movement and errors that are inherent in cantilever-based systems.
Compared to conventional instrumented nanoindenters, the MFP NanoIndenter provides
lower detection limits and higher resolution measurements of force and indentation
depth with the superior precision of AFM sensing technology. The positioning
accuracy is subnanometer using the MFP's closed loop nanopositioning sensors.
The NanoIndenter can operate under fluid and at temperatures up to 300C.
Asylum Research President, Dr. Roger Proksch commented "Our MFP NanoIndenter
offers clear advantages over both AFM-based and conventional nanoindenters and
the AVS Product Award further validates our approach. The indenter is completely
integrated with the AFM, providing the unique ability to quantify contact areas
by performing AFM metrology of both the indenting tip and the resulting indentation.
These direct measurements enable analysis of material properties with unprecedented
accuracy relative to indirect calculation methods."