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Results 21 - 30 of 119 for Scanning microscopy
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    Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processing software for "nano-microscopy". Our mission is to provide our customers with...
  • Supplier Profile
    TESCAN enables nanoscale investigation and analysis within the geosciences, materials science, life sciences and semiconductor industries. The company has a 30-year history of developing innovative...
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    JanisULT designs and builds refrigerators for operation below 1 K with a focus on quantum technology applications. We offer the widest range of helium-3 refrigerators and dilution refrigerators...
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    Gatan, Inc. is the world's leading manufacturer of instrumentation and software used to enhance and extend the operation and performance of electron microscopes. Gatan's products, which are...
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    We are a nanoscience and nanotechnology research group in the School of Materials Science and Engineering of the Georgia Institute of Technology. Our recent research is focused on the fundamental...
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    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
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    Founded in 1989, Digital Surf is a leading provider of innovative solutions for micro and nano-surface metrology for use in research laboratory, industrial and production environments. Our company is...
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    The National University of Singapore (NUS) acknowledges the global trend that nanotechnology is expected to be a key technology. NUS, in tradition of spearheading cutting-edge research programs, has...
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    Our pursuit is progress for people everywhere. That's why we take a closer look at things, ask questions, and think ahead. We've been around for more than 350 years, yet our majority owners...
  • Supplier Profile
    Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes and ion-beam systems,...

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